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AIP Advances, volume 5, issue 6, pages 67168

Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon

Schinke Carsten ¹

Peest C. ¹

Schmidt Jan ^{1, 2}

Brendel Rolf ^{1, 2}

Bothe Karsten ¹

Vogt Malte R ²

Kröger Ingo ³

Winter Stefan ³

Schirmacher Alfred ³

Lim Siew ⁴

Nguyen Hieu T ⁴

MacDonald Daniel ⁴

Hide authors affiliations Show authors affiliations: 4 affiliations

Institute for Solar Energy Research Hamelin (ISFH) 1 , Am Ohrberg 1, 31860 Emmerthal, Germany |

Leibniz University of Hanover (LUH) 2 , Institute for Solid State Physics, Appelstraße 2, 30167 Hannover, Germany |

Physikalisch-Technische Bundesanstalt (PTB) 3 , Bundesallee 100, 38116 Braunschweig, Germany |

⁴

The Australian National University (ANU) 4 , College of Engineering and Computer Science, Canberra, ACT 0200, Australia |

Publication type: Journal Article

Publication date: 2015-06-01

American Institute of Physics (AIP)

Journal: AIP Advances

Quartile SCImago

Quartile WOS

Impact factor: 1.6

ISSN: 21583226

DOI: 10.1063/1.4923379

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General Physics and Astronomy

Abstract

We analyze the uncertainty of the coefficient of band-to-band absorption of crystalline silicon. For this purpose, we determine the absorption coefficient at room temperature (295 K) in the wavelength range from 250 to 1450 nm using four different measurement methods. The data presented in this work derive from spectroscopic ellipsometry, measurements of reflectance and transmittance, spectrally resolved luminescence measurements and spectral responsivity measurements. A systematic measurement uncertainty analysis based on the Guide to the expression of uncertainty in measurement (GUM) as well as an extensive characterization of the measurement setups are carried out for all methods. We determine relative uncertainties of the absorption coefficient of 0.4% at 250 nm, 11% at 600 nm, 1.4% at 1000 nm, 12% at 1200 nm and 180% at 1450 nm. The data are consolidated by intercomparison of results obtained at different institutions and using different measurement approaches.

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Citations by journals

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Optics Express	Optics Express, 22, 7.24% Optics Express 22 publications, 7.24%
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ACS Photonics	ACS Photonics, 9, 2.96% ACS Photonics 9 publications, 2.96%
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Journal of Physical Chemistry C	Journal of Physical Chemistry C, 4, 1.32% Journal of Physical Chemistry C 4 publications, 1.32%
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Applied Physics Letters	Applied Physics Letters, 3, 0.99% Applied Physics Letters 3 publications, 0.99%
Physical Review A	Physical Review A, 3, 0.99% Physical Review A 3 publications, 0.99%
Journal of Quantitative Spectroscopy and Radiative Transfer	Journal of Quantitative Spectroscopy and Radiative Transfer, 3, 0.99% Journal of Quantitative Spectroscopy and Radiative Transfer 3 publications, 0.99%
Plasmonics	Plasmonics, 3, 0.99% Plasmonics 3 publications, 0.99%
Journal of Physics: Conference Series	Journal of Physics: Conference Series, 3, 0.99% Journal of Physics: Conference Series 3 publications, 0.99%
Physica Status Solidi (A) Applications and Materials Science	Physica Status Solidi (A) Applications and Materials Science, 3, 0.99% Physica Status Solidi (A) Applications and Materials Science 3 publications, 0.99%
Laser and Photonics Reviews	Laser and Photonics Reviews, 3, 0.99% Laser and Photonics Reviews 3 publications, 0.99%
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Citations by publishers

	5 10 15 20 25 30 35 40 45 50
Elsevier	Elsevier, 48, 15.79% Elsevier 48 publications, 15.79%
Optical Society of America	Optical Society of America, 38, 12.5% Optical Society of America 38 publications, 12.5%
Wiley	Wiley, 30, 9.87% Wiley 30 publications, 9.87%
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American Chemical Society (ACS)	American Chemical Society (ACS), 24, 7.89% American Chemical Society (ACS) 24 publications, 7.89%
Springer Nature	Springer Nature, 24, 7.89% Springer Nature 24 publications, 7.89%
IEEE	IEEE, 19, 6.25% IEEE 19 publications, 6.25%
American Institute of Physics (AIP)	American Institute of Physics (AIP), 16, 5.26% American Institute of Physics (AIP) 16 publications, 5.26%
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Royal Society of Chemistry (RSC)	Royal Society of Chemistry (RSC), 13, 4.28% Royal Society of Chemistry (RSC) 13 publications, 4.28%
IOP Publishing	IOP Publishing, 6, 1.97% IOP Publishing 6 publications, 1.97%
Pleiades Publishing	Pleiades Publishing, 5, 1.64% Pleiades Publishing 5 publications, 1.64%
Japan Society of Applied Physics	Japan Society of Applied Physics, 4, 1.32% Japan Society of Applied Physics 4 publications, 1.32%
Taylor & Francis	Taylor & Francis, 4, 1.32% Taylor & Francis 4 publications, 1.32%
SPIE	SPIE, 3, 0.99% SPIE 3 publications, 0.99%
World Scientific	World Scientific, 2, 0.66% World Scientific 2 publications, 0.66%
Walter de Gruyter	Walter de Gruyter, 2, 0.66% Walter de Gruyter 2 publications, 0.66%
SAGE	SAGE, 1, 0.33% SAGE 1 publication, 0.33%
Chinese Ceramic Society	Chinese Ceramic Society, 1, 0.33% Chinese Ceramic Society 1 publication, 0.33%
American Association for the Advancement of Science (AAAS)	American Association for the Advancement of Science (AAAS), 1, 0.33% American Association for the Advancement of Science (AAAS) 1 publication, 0.33%
Hans Publishers	Hans Publishers, 1, 0.33% Hans Publishers 1 publication, 0.33%
Lviv Polytechnic National University	Lviv Polytechnic National University, 1, 0.33% Lviv Polytechnic National University 1 publication, 0.33%
	5 10 15 20 25 30 35 40 45 50

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Schinke C. et al. Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon // AIP Advances. 2015. Vol. 5. No. 6. p. 67168.

GOST all authors (up to 50) Copy

Schinke C., Peest C., Schmidt J., Brendel R., Bothe K., Vogt M. R., Kröger I., Winter S., Schirmacher A., Lim S., Nguyen H. T., MacDonald D. Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon // AIP Advances. 2015. Vol. 5. No. 6. p. 67168.

RIS |

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RIS Copy

TY - JOUR

DO - 10.1063/1.4923379

UR - https://doi.org/10.1063%2F1.4923379

TI - Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon

T2 - AIP Advances

AU - Schinke, Carsten

AU - Peest, C.

AU - Schmidt, Jan

AU - Brendel, Rolf

AU - Bothe, Karsten

AU - Vogt, Malte R

AU - Kröger, Ingo

AU - Winter, Stefan

AU - Schirmacher, Alfred

AU - Lim, Siew

AU - Nguyen, Hieu T

AU - MacDonald, Daniel

PY - 2015

DA - 2015/06/01 00:00:00

PB - American Institute of Physics (AIP)

SP - 67168

IS - 6

VL - 5

SN - 2158-3226

ER -

BibTex |

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BibTex Copy

@article{2015_Schinke,

author = {Carsten Schinke and C. Peest and Jan Schmidt and Rolf Brendel and Karsten Bothe and Malte R Vogt and Ingo Kröger and Stefan Winter and Alfred Schirmacher and Siew Lim and Hieu T Nguyen and Daniel MacDonald},

title = {Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon},

journal = {AIP Advances},

year = {2015},

volume = {5},

publisher = {American Institute of Physics (AIP)},

month = {jun},

url = {https://doi.org/10.1063%2F1.4923379},

number = {6},

pages = {67168},

doi = {10.1063/1.4923379}

}

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Schinke, Carsten, et al. “Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon.” AIP Advances, vol. 5, no. 6, Jun. 2015, p. 67168. https://doi.org/10.1063%2F1.4923379.

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Publisher

American Institute of Physics (AIP)

Journal

AIP Advances

Quartile SCImago

Quartile WOS

Impact factor

1.6

ISSN

21583226 (Print)