Open Access
Open access
Applied Surface Science, volume 448, pages 154-162

XPS study of ion irradiated and unirradiated CeO 2 bulk and thin film samples

Kalmykov Stepan N.
Petrov Vladimir G
Teterin Yury A 2, 3
Teterin Anton Yu 5
Ivanov Kirill E 5
Petrov Peter K.
Farnan Ian 4
Petrov Peter 6
Publication typeJournal Article
Publication date2018-08-01
Quartile SCImago
Q1
Quartile WOS
Q1
Impact factor6.7
ISSN01694332
Surfaces, Coatings and Films
General Chemistry
General Physics and Astronomy
Condensed Matter Physics
Surfaces and Interfaces
Abstract
Abstract This work considers the effect of fission-energy ion irradiation on the electronic structure at the surface of bulk and thin film samples of CeO2 as a simulant for UO2 nuclear fuel. For this purpose, thin films of CeO2 grown on Si substrates and bulk CeO2 samples were irradiated by Xe ions (92 MeV, 4.8 × 1015 ions/cm2) to simulate the fission damage that occurs within nuclear fuels. The irradiated and unirradiated samples were characterized by X-ray photoelectron spectroscopy. A technique of the quantitative evaluation of cerium ionic composition on the surface of the samples has been successfully applied to the obtained XPS spectra. This technique is based on the intensity of only one of the reliably identifiable high-energy peak at 916.6 eV in the Ce 3d XPS spectra. The as-produced samples were found to contain mostly the Ce4+ ions with a small fraction of Ce3+ ions formed on the surface in the air or under X-rays. The core-electron XPS structure of CeO2 was associated with the complex final state with vacancies (holes) resulting from the photoemission of an inner electron. The Xe ion irradiation was found to increase the Ce3+ content in the samples of CeO2, with the thin films being more sensitive than the bulks samples.

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GOST Copy
Maslakov K. et al. XPS study of ion irradiated and unirradiated CeO 2 bulk and thin film samples // Applied Surface Science. 2018. Vol. 448. pp. 154-162.
GOST all authors (up to 50) Copy
Maslakov K., Teterin Y. A., Popel A. J., Teterin A. Yu., Ivanov K. E., Kalmykov S. N., Petrov V. G., Petrov P. K., Farnan I., Kalmykov S. N., Petrov V. G., Petrov P. XPS study of ion irradiated and unirradiated CeO 2 bulk and thin film samples // Applied Surface Science. 2018. Vol. 448. pp. 154-162.
RIS |
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RIS Copy
TY - JOUR
DO - 10.1016/j.apsusc.2018.04.077
UR - https://doi.org/10.1016%2Fj.apsusc.2018.04.077
TI - XPS study of ion irradiated and unirradiated CeO 2 bulk and thin film samples
T2 - Applied Surface Science
AU - Maslakov, Konstantin
AU - Teterin, Yury A
AU - Popel, Aleksej J
AU - Teterin, Anton Yu
AU - Ivanov, Kirill E
AU - Kalmykov, Stepan N.
AU - Petrov, Vladimir G
AU - Petrov, Peter K.
AU - Farnan, Ian
AU - Kalmykov, Stepan N.
AU - Petrov, Vladimir G
AU - Petrov, Peter
PY - 2018
DA - 2018/08/01 00:00:00
PB - Elsevier
SP - 154-162
VL - 448
SN - 0169-4332
ER -
BibTex
Cite this
BibTex Copy
@article{2018_Maslakov
author = {Konstantin Maslakov and Yury A Teterin and Aleksej J Popel and Anton Yu Teterin and Kirill E Ivanov and Stepan N. Kalmykov and Vladimir G Petrov and Peter K. Petrov and Ian Farnan and Stepan N. Kalmykov and Vladimir G Petrov and Peter Petrov},
title = {XPS study of ion irradiated and unirradiated CeO 2 bulk and thin film samples},
journal = {Applied Surface Science},
year = {2018},
volume = {448},
publisher = {Elsevier},
month = {aug},
url = {https://doi.org/10.1016%2Fj.apsusc.2018.04.077},
pages = {154--162},
doi = {10.1016/j.apsusc.2018.04.077}
}
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