Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source
Publication type: Journal Article
Publication date: 2020-03-12
scimago Q3
wos Q3
SJR: 0.370
CiteScore: 2.6
Impact factor: 1.9
ISSN: 02321300, 15214079
General Chemistry
Condensed Matter Physics
General Materials Science
Abstract
Introduction of “Belok/XSA” beamline-modernization is presented here with commissioning of a modern synchrotron beamline with unique capabilities for the structural analysis of single and polycrystalline samples. The beamline is designed to perform important tasks in modern crystallography, such as solving and refining the atomic structure using the single- and polycrystal method, studying the real (defective) structure, and analyzing the distribution of electron density in crystals, it is also possible to study rapidly occurring processes, for example, temperature phase transitions. Due to the speed of data accumulation and a registration over a large solid angle, the method allows to study large numbers of samples. This beamline has become extremely demanded in the chemical, biological, material science, and archaeological community in Russia.
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Total citations:
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Svetogorov R., Dorovatovskii P., Lazarenko V. A. Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source // Crystal Research and Technology. 2020. Vol. 55. No. 5. p. 1900184.
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Svetogorov R., Dorovatovskii P., Lazarenko V. A. Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source // Crystal Research and Technology. 2020. Vol. 55. No. 5. p. 1900184.
Cite this
RIS
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TY - JOUR
DO - 10.1002/crat.201900184
UR - https://doi.org/10.1002/crat.201900184
TI - Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source
T2 - Crystal Research and Technology
AU - Svetogorov, Roman
AU - Dorovatovskii, Pavel
AU - Lazarenko, Vladimir A.
PY - 2020
DA - 2020/03/12
PB - Wiley
SP - 1900184
IS - 5
VL - 55
SN - 0232-1300
SN - 1521-4079
ER -
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BibTex (up to 50 authors)
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@article{2020_Svetogorov,
author = {Roman Svetogorov and Pavel Dorovatovskii and Vladimir A. Lazarenko},
title = {Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source},
journal = {Crystal Research and Technology},
year = {2020},
volume = {55},
publisher = {Wiley},
month = {mar},
url = {https://doi.org/10.1002/crat.201900184},
number = {5},
pages = {1900184},
doi = {10.1002/crat.201900184}
}
Cite this
MLA
Copy
Svetogorov, Roman, et al. “Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source.” Crystal Research and Technology, vol. 55, no. 5, Mar. 2020, p. 1900184. https://doi.org/10.1002/crat.201900184.