Crystal Research and Technology, volume 55, issue 5, pages 1900184
Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source
Publication type: Journal Article
Publication date: 2020-03-12
Journal:
Crystal Research and Technology
Quartile SCImago
Q3
Quartile WOS
Q3
Impact factor: 1.5
ISSN: 02321300, 15214079
General Chemistry
Condensed Matter Physics
General Materials Science
Abstract
Introduction of “Belok/XSA” beamline-modernization is presented here with commissioning of a modern synchrotron beamline with unique capabilities for the structural analysis of single and polycrystalline samples. The beamline is designed to perform important tasks in modern crystallography, such as solving and refining the atomic structure using the single- and polycrystal method, studying the real (defective) structure, and analyzing the distribution of electron density in crystals, it is also possible to study rapidly occurring processes, for example, temperature phase transitions. Due to the speed of data accumulation and a registration over a large solid angle, the method allows to study large numbers of samples. This beamline has become extremely demanded in the chemical, biological, material science, and archaeological community in Russia.
Citations by journals
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Russian Journal of Coordination Chemistry/Koordinatsionnaya Khimiya
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Russian Journal of Coordination Chemistry/Koordinatsionnaya Khimiya
9 publications, 5.77%
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Journal of Structural Chemistry
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International Journal of Molecular Sciences
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International Journal of Molecular Sciences
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Crystals
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Crystallography Reports
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Dalton Transactions
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Molecules
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CrystEngComm
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CrystEngComm
6 publications, 3.85%
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Journal of Alloys and Compounds
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Journal of Alloys and Compounds
4 publications, 2.56%
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European Journal of Inorganic Chemistry
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European Journal of Inorganic Chemistry
3 publications, 1.92%
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Russian Chemical Bulletin
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Russian Chemical Bulletin
3 publications, 1.92%
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Russian Journal of General Chemistry
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Russian Journal of General Chemistry
3 publications, 1.92%
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3 publications, 1.92%
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Russian Journal of Inorganic Chemistry
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3 publications, 1.92%
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2 publications, 1.28%
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Mendeleev Communications
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2 publications, 1.28%
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Journal of Luminescence
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2 publications, 1.28%
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New Journal of Chemistry
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2 publications, 1.28%
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2 publications, 1.28%
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Bulletin of the Russian Academy of Sciences: Physics
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Bulletin of the Russian Academy of Sciences: Physics
2 publications, 1.28%
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Moscow University Physics Bulletin (English Translation of Vestnik Moskovskogo Universiteta, Fizika)
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2 publications, 1.28%
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2 publications, 1.28%
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MolBank
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2 publications, 1.28%
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Inorganics
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2 publications, 1.28%
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Polyhedron
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2 publications, 1.28%
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Solid State Sciences
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Solid State Sciences
2 publications, 1.28%
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Journal of Magnetism and Magnetic Materials
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Journal of Magnetism and Magnetic Materials
1 publication, 0.64%
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Journal of Environmental Radioactivity
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Journal of Environmental Radioactivity
1 publication, 0.64%
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Antioxidants
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Antioxidants
1 publication, 0.64%
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Citations by publishers
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35
40
45
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Pleiades Publishing
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Pleiades Publishing
42 publications, 26.92%
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Multidisciplinary Digital Publishing Institute (MDPI)
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38 publications, 24.36%
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Elsevier
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Elsevier
32 publications, 20.51%
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Royal Society of Chemistry (RSC)
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Royal Society of Chemistry (RSC)
17 publications, 10.9%
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American Chemical Society (ACS)
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American Chemical Society (ACS)
10 publications, 6.41%
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Springer Nature
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Springer Nature
7 publications, 4.49%
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Wiley
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Wiley
5 publications, 3.21%
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IOP Publishing
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IOP Publishing
2 publications, 1.28%
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Trans Tech Publications
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Trans Tech Publications
1 publication, 0.64%
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Cambridge University Press
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Cambridge University Press
1 publication, 0.64%
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RTU MIREA
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RTU MIREA
1 publication, 0.64%
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- We do not take into account publications that without a DOI.
- Statistics recalculated only for publications connected to researchers, organizations and labs registered on the platform.
- Statistics recalculated weekly.
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Svetogorov R., Dorovatovskii P., Lazarenko V. A. Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source // Crystal Research and Technology. 2020. Vol. 55. No. 5. p. 1900184.
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Svetogorov R., Dorovatovskii P., Lazarenko V. A. Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source // Crystal Research and Technology. 2020. Vol. 55. No. 5. p. 1900184.
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TY - JOUR
DO - 10.1002/crat.201900184
UR - https://doi.org/10.1002%2Fcrat.201900184
TI - Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source
T2 - Crystal Research and Technology
AU - Lazarenko, Vladimir A.
AU - Svetogorov, Roman
AU - Dorovatovskii, Pavel
PY - 2020
DA - 2020/03/12 00:00:00
PB - Wiley
SP - 1900184
IS - 5
VL - 55
SN - 0232-1300
SN - 1521-4079
ER -
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@article{2020_Svetogorov,
author = {Vladimir A. Lazarenko and Roman Svetogorov and Pavel Dorovatovskii},
title = {Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source},
journal = {Crystal Research and Technology},
year = {2020},
volume = {55},
publisher = {Wiley},
month = {mar},
url = {https://doi.org/10.1002%2Fcrat.201900184},
number = {5},
pages = {1900184},
doi = {10.1002/crat.201900184}
}
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MLA
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Svetogorov, Roman, et al. “Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source.” Crystal Research and Technology, vol. 55, no. 5, Mar. 2020, p. 1900184. https://doi.org/10.1002%2Fcrat.201900184.