Comparison of LEIS, SIMS, and AR‐XPS as Methods for Surface Characterization of Passivated Zn–Al–Mg Steel

ABSTRACT

The combination of different surface‐sensitive techniques is frequently used in material sciences to analyze complex systems. How these methods compare in terms of quantitative and qualitative information is often unclear. In this study, we directly compare low‐energy ion scattering spectroscopy (LEIS), secondary ion mass spectrometry (SIMS), and angle‐resolved X‐ray photoelectron spectroscopy (AR‐XPS) depth profiling analyses. Therefore, we use the Zn–Al–Mg model coatings after alkaline and acidic treatments in model solutions. The combined use of AR‐XPS and LEIS depth profiling proved effective in studying compositional and elemental changes in the surface oxides of Zn–Al–Mg coatings after alkaline and acidic treatments. Additionally, by combining these methods, SIMS depth profiling can be effectively calibrated for matrix effects. Here, we find that, for example, Mg is considerably more sensitive to SIMS detection, based on effective secondary ionisation. Such effects must be considered for data interpretation.