volume 3 issue 7 pages 1800044

Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics

Shashank S Pandey 1
Niladri Banerjee 1
Yan Xie 1
Carlos Mastrangelo 1
1
 
Department of Electrical and Computer Engineering; 50 S. Central Campus Drive, Meb Room 2110 SlC UT 84112 USA
Publication typeJournal Article
Publication date2018-06-07
scimago Q1
wos Q2
SJR1.549
CiteScore11.0
Impact factor6.2
ISSN2365709X
General Materials Science
Industrial and Manufacturing Engineering
Mechanics of Materials
Found 
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GOST |
Cite this
GOST Copy
Pandey S. S. et al. Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics // Advanced Materials Technologies. 2018. Vol. 3. No. 7. p. 1800044.
GOST all authors (up to 50) Copy
Pandey S. S., Banerjee N., Xie Y., Mastrangelo C. Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics // Advanced Materials Technologies. 2018. Vol. 3. No. 7. p. 1800044.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1002/admt.201800044
UR - https://doi.org/10.1002/admt.201800044
TI - Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics
T2 - Advanced Materials Technologies
AU - Pandey, Shashank S
AU - Banerjee, Niladri
AU - Xie, Yan
AU - Mastrangelo, Carlos
PY - 2018
DA - 2018/06/07
PB - Wiley
SP - 1800044
IS - 7
VL - 3
SN - 2365-709X
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2018_Pandey,
author = {Shashank S Pandey and Niladri Banerjee and Yan Xie and Carlos Mastrangelo},
title = {Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics},
journal = {Advanced Materials Technologies},
year = {2018},
volume = {3},
publisher = {Wiley},
month = {jun},
url = {https://doi.org/10.1002/admt.201800044},
number = {7},
pages = {1800044},
doi = {10.1002/admt.201800044}
}
MLA
Cite this
MLA Copy
Pandey, Shashank S., et al. “Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics.” Advanced Materials Technologies, vol. 3, no. 7, Jun. 2018, p. 1800044. https://doi.org/10.1002/admt.201800044.