Advanced Materials Technologies, volume 3, issue 7, pages 1800044
Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics
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Department of Electrical and Computer Engineering; 50 S. Central Campus Drive, Meb Room 2110 SlC UT 84112 USA
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Publication type: Journal Article
Publication date: 2018-06-07
Journal:
Advanced Materials Technologies
Quartile SCImago
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Quartile WOS
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Impact factor: 6.8
ISSN: 2365709X
General Materials Science
Industrial and Manufacturing Engineering
Mechanics of Materials
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GOST
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Pandey S. S. et al. Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics // Advanced Materials Technologies. 2018. Vol. 3. No. 7. p. 1800044.
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Pandey S. S., Banerjee N., Xie Y., Mastrangelo C. Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics // Advanced Materials Technologies. 2018. Vol. 3. No. 7. p. 1800044.
Cite this
RIS
Copy
TY - JOUR
DO - 10.1002/admt.201800044
UR - https://doi.org/10.1002/admt.201800044
TI - Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics
T2 - Advanced Materials Technologies
AU - Pandey, Shashank S
AU - Banerjee, Niladri
AU - Xie, Yan
AU - Mastrangelo, Carlos
PY - 2018
DA - 2018/06/07
PB - Wiley
SP - 1800044
IS - 7
VL - 3
SN - 2365-709X
ER -
Cite this
BibTex
Copy
@article{2018_Pandey,
author = {Shashank S Pandey and Niladri Banerjee and Yan Xie and Carlos Mastrangelo},
title = {Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics},
journal = {Advanced Materials Technologies},
year = {2018},
volume = {3},
publisher = {Wiley},
month = {jun},
url = {https://doi.org/10.1002/admt.201800044},
number = {7},
pages = {1800044},
doi = {10.1002/admt.201800044}
}
Cite this
MLA
Copy
Pandey, Shashank S., et al. “Self-Destructing Secured Microchips by On-Chip Triggered Energetic and Corrosive Attacks for Transient Electronics.” Advanced Materials Technologies, vol. 3, no. 7, Jun. 2018, p. 1800044. https://doi.org/10.1002/admt.201800044.