Friction Force Microscopy

Publication typeBook Chapter
Publication date2024-08-31
SJR
CiteScore0.4
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ISSN14344904, 21977127
Abstract
Friction force microscopy is a key experimental method in nanotribology. The tip of an atomic force microscope is moved in contact over a surfaces and friction forces are detected as deflection of a micro-mechanical force sensor. While the method appears simple, special care must be taken to calibrate the force sensor and to understand the challenges in bridging the gap between molecular forces and macroscopic experiment. We discuss experimental procedures such as measurements of friction as function of load or of temperature, and on inhomogeneous materials. The chapter ends with an overview of dynamic measurements of friction, where the tip is oscillated laterally in contact or above the surface to probe dissipative interactions with the highest sensitivity.
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GOST Copy
Bennewitz R. Friction Force Microscopy // NanoScience and Technology. 2024. pp. 1-16.
GOST all authors (up to 50) Copy
Bennewitz R. Friction Force Microscopy // NanoScience and Technology. 2024. pp. 1-16.
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RIS Copy
TY - GENERIC
DO - 10.1007/978-3-031-63065-1_1
UR - https://link.springer.com/10.1007/978-3-031-63065-1_1
TI - Friction Force Microscopy
T2 - NanoScience and Technology
AU - Bennewitz, Roland
PY - 2024
DA - 2024/08/31
PB - Springer Nature
SP - 1-16
SN - 1434-4904
SN - 2197-7127
ER -
BibTex
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BibTex (up to 50 authors) Copy
@incollection{2024_Bennewitz,
author = {Roland Bennewitz},
title = {Friction Force Microscopy},
publisher = {Springer Nature},
year = {2024},
pages = {1--16},
month = {aug}
}