Open Access
Open access

An Incremental Unified Framework for Small Defect Inspection

Jiaqi Tang 1, 2, 3
Hao Lu 1, 2
Xiaogang Xu 4
Ruizheng Wu 5
Sixing Hu 5
Tong Zhang 6
Tsz Wa Cheng 6
Ming Ge 7
Ying-Cong Chen 1, 2, 3
FUGEE TSUNG 1, 2
Publication typeBook Chapter
Publication date2024-10-26
scimago Q2
SJR0.352
CiteScore2.4
Impact factor
ISSN03029743, 16113349, 18612075, 18612083
Abstract
Artificial Intelligence (AI)-driven defect inspection is pivotal in industrial manufacturing. However, existing inspection systems are typically designed for specific industrial products and struggle with diverse product portfolios and evolving processes. Although some previous studies attempt to address object dynamics by storing embeddings in the reserved memory bank, these methods suffer from memory capacity limitations and object distribution conflicts. To tackle these issues, we propose the Incremental Unified Framework (IUF), which integrates incremental learning into a unified reconstruction-based detection method, thus eliminating the need for feature storage in the memory. Based on IUF, we introduce Object-Aware Self-Attention (OASA) to delineate distinct semantic boundaries. We also integrate Semantic Compression Loss (SCL) to optimize non-primary semantic space, enhancing network adaptability for new objects. Additionally, we prioritize retaining the features of established objects during weight updates. Demonstrating prowess in both image and pixel-level defect inspection, our approach achieves state-of-the-art performance, supporting dynamic and scalable industrial inspections. Our code is released at https://github.com/jqtangust/IUF .
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Journals

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2
IEEE Transactions on Industrial Informatics
2 publications, 33.33%
Neural Networks
1 publication, 16.67%
Lecture Notes in Computer Science
1 publication, 16.67%
Applied Intelligence
1 publication, 16.67%
1
2

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3
Institute of Electrical and Electronics Engineers (IEEE)
3 publications, 50%
Springer Nature
2 publications, 33.33%
Elsevier
1 publication, 16.67%
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GOST |
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GOST Copy
Tang J. et al. An Incremental Unified Framework for Small Defect Inspection // Lecture Notes in Computer Science. 2024. pp. 307-324.
GOST all authors (up to 50) Copy
Tang J., Lu H., Xu X., Wu R., Hu S., Zhang T., Cheng T. W., Ge M., Chen Y., TSUNG F. An Incremental Unified Framework for Small Defect Inspection // Lecture Notes in Computer Science. 2024. pp. 307-324.
RIS |
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RIS Copy
TY - GENERIC
DO - 10.1007/978-3-031-72751-1_18
UR - https://link.springer.com/10.1007/978-3-031-72751-1_18
TI - An Incremental Unified Framework for Small Defect Inspection
T2 - Lecture Notes in Computer Science
AU - Tang, Jiaqi
AU - Lu, Hao
AU - Xu, Xiaogang
AU - Wu, Ruizheng
AU - Hu, Sixing
AU - Zhang, Tong
AU - Cheng, Tsz Wa
AU - Ge, Ming
AU - Chen, Ying-Cong
AU - TSUNG, FUGEE
PY - 2024
DA - 2024/10/26
PB - Springer Nature
SP - 307-324
SN - 0302-9743
SN - 1611-3349
SN - 1861-2075
SN - 1861-2083
ER -
BibTex
Cite this
BibTex (up to 50 authors) Copy
@incollection{2024_Tang,
author = {Jiaqi Tang and Hao Lu and Xiaogang Xu and Ruizheng Wu and Sixing Hu and Tong Zhang and Tsz Wa Cheng and Ming Ge and Ying-Cong Chen and FUGEE TSUNG},
title = {An Incremental Unified Framework for Small Defect Inspection},
publisher = {Springer Nature},
year = {2024},
pages = {307--324},
month = {oct}
}