Picosecond measurements of exciton trapping in semiconductor clusters
Publication type: Journal Article
Publication date: 1990-04-01
scimago Q2
wos Q2
SJR: 0.546
CiteScore: 5.9
Impact factor: 3.1
ISSN: 00092614, 18734448
Physical and Theoretical Chemistry
General Physics and Astronomy
Abstract
The formation of deep traps in 30 A CdS semiconductor clusters has been time resolved using picosecond single-photon counting. The trapping rates, measured by the risetime of recombinate or emission, vary inversely with trap depth ranging from ≈ 30 ps above 500 nm to
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Total citations:
50
Citations from 2024:
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GOST
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ONeil M. et al. Picosecond measurements of exciton trapping in semiconductor clusters // Chemical Physics Letters. 1990. Vol. 168. No. 2. pp. 208-210.
GOST all authors (up to 50)
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ONeil M., Marohn J. A., McLendon G. Picosecond measurements of exciton trapping in semiconductor clusters // Chemical Physics Letters. 1990. Vol. 168. No. 2. pp. 208-210.
Cite this
RIS
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TY - JOUR
DO - 10.1016/0009-2614(90)85131-U
UR - https://doi.org/10.1016/0009-2614(90)85131-U
TI - Picosecond measurements of exciton trapping in semiconductor clusters
T2 - Chemical Physics Letters
AU - ONeil, Mike
AU - Marohn, John A.
AU - McLendon, George
PY - 1990
DA - 1990/04/01
PB - Elsevier
SP - 208-210
IS - 2
VL - 168
SN - 0009-2614
SN - 1873-4448
ER -
Cite this
BibTex (up to 50 authors)
Copy
@article{1990_ONeil,
author = {Mike ONeil and John A. Marohn and George McLendon},
title = {Picosecond measurements of exciton trapping in semiconductor clusters},
journal = {Chemical Physics Letters},
year = {1990},
volume = {168},
publisher = {Elsevier},
month = {apr},
url = {https://doi.org/10.1016/0009-2614(90)85131-U},
number = {2},
pages = {208--210},
doi = {10.1016/0009-2614(90)85131-U}
}
Cite this
MLA
Copy
ONeil, Mike, et al. “Picosecond measurements of exciton trapping in semiconductor clusters.” Chemical Physics Letters, vol. 168, no. 2, Apr. 1990, pp. 208-210. https://doi.org/10.1016/0009-2614(90)85131-U.