Thickness dependent properties of chemically deposited Bi2S3 thin films
Тип публикации: Journal Article
Дата публикации: 1997-06-01
scimago Q2
wos Q3
БС1
SJR: 0.419
CiteScore: 3.9
Impact factor: 2.0
ISSN: 00406090, 18792731
Materials Chemistry
Metals and Alloys
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Краткое описание
Thin films of Bi2S3 with different thicknesses were prepared by the chemical deposition method from an aqueous acidic bath using thiosulfate as a sulfide ion source. The effect of film thickness on the optical, structural and electrical properties was studied. A shift of 0.6 eV in the optical bandgap energy, Eg, and a decrease in electrical resistivity from 2.8 × 104 to 5 × 103 Ω cm and an increase in grain size of Bi2S3 crystallites from 5.2 to 8.0 nm were observed when the thickness was varied from 52.7 to 220 nm. These changes are attributed to the quantum size effect in semiconducting films.
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Lokhande C. D., Ubale A. U., Patil P. S. Thickness dependent properties of chemically deposited Bi2S3 thin films // Thin Solid Films. 1997. Vol. 302. No. 1-2. pp. 1-4.
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Lokhande C. D., Ubale A. U., Patil P. S. Thickness dependent properties of chemically deposited Bi2S3 thin films // Thin Solid Films. 1997. Vol. 302. No. 1-2. pp. 1-4.
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TY - JOUR
DO - 10.1016/s0040-6090(96)09540-5
UR - https://doi.org/10.1016/s0040-6090(96)09540-5
TI - Thickness dependent properties of chemically deposited Bi2S3 thin films
T2 - Thin Solid Films
AU - Lokhande, Chandrakant D
AU - Ubale, A U
AU - Patil, P. S.
PY - 1997
DA - 1997/06/01
PB - Elsevier
SP - 1-4
IS - 1-2
VL - 302
SN - 0040-6090
SN - 1879-2731
ER -
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@article{1997_Lokhande,
author = {Chandrakant D Lokhande and A U Ubale and P. S. Patil},
title = {Thickness dependent properties of chemically deposited Bi2S3 thin films},
journal = {Thin Solid Films},
year = {1997},
volume = {302},
publisher = {Elsevier},
month = {jun},
url = {https://doi.org/10.1016/s0040-6090(96)09540-5},
number = {1-2},
pages = {1--4},
doi = {10.1016/s0040-6090(96)09540-5}
}
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MLA
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Lokhande, Chandrakant D., et al. “Thickness dependent properties of chemically deposited Bi2S3 thin films.” Thin Solid Films, vol. 302, no. 1-2, Jun. 1997, pp. 1-4. https://doi.org/10.1016/s0040-6090(96)09540-5.