том 119 издание 1 страницы 29-33

High-resolution valence band XPS studies of thin film Au–Al alloys

Тип публикацииJournal Article
Дата публикации2001-07-01
scimago Q2
wos Q3
БС2
SJR0.601
CiteScore3.6
Impact factor1.5
ISSN03682048, 18732526
Electronic, Optical and Magnetic Materials
Physical and Theoretical Chemistry
Spectroscopy
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Radiation
Краткое описание
The Maximum Entropy Method (MEM) has been used to deconvolute the valence-band XPS spectra of thin film Au–Al alloys. The enhanced resolution allows fine changes in the electronic structures of the thin film alloys to be distinguished with the aid of the Au4f core-level spectra. This particular alloy series allows one to examine the 5d electronic interaction between gold atoms as aluminum is gradually added to the matrix. Aluminum is shown to have a much stronger quenching effect on such interactions than has been found previously for copper.
Найдено 
Для доступа к списку цитирований публикации необходимо авторизоваться.
Для доступа к списку профилей, цитирующих публикацию, необходимо авторизоваться.

Топ-30

Журналы

1
2
Journal of Electron Spectroscopy and Related Phenomena
2 публикации, 8%
Microelectronics Reliability
2 публикации, 8%
Applied Surface Science
2 публикации, 8%
Chemistry - A European Journal
1 публикация, 4%
Physical Review B
1 публикация, 4%
EPJ Applied Physics
1 публикация, 4%
Thin Solid Films
1 публикация, 4%
Journal of Materials Research
1 публикация, 4%
Journal of Electronic Materials
1 публикация, 4%
Surface and Coatings Technology
1 публикация, 4%
Journal of Alloys and Compounds
1 публикация, 4%
Mendeleev Communications
1 публикация, 4%
Corrosion Science
1 публикация, 4%
ChemPhysChem
1 публикация, 4%
Surface and Interface Analysis
1 публикация, 4%
Journal of Physical Chemistry C
1 публикация, 4%
Nanoscale
1 публикация, 4%
CrystEngComm
1 публикация, 4%
Physical Chemistry Chemical Physics
1 публикация, 4%
Journal of Photopolymer Science and Technology
1 публикация, 4%
Nano Energy
1 публикация, 4%
1
2

Издатели

2
4
6
8
10
12
Elsevier
11 публикаций, 44%
Wiley
4 публикации, 16%
Royal Society of Chemistry (RSC)
3 публикации, 12%
Springer Nature
2 публикации, 8%
American Physical Society (APS)
1 публикация, 4%
EDP Sciences
1 публикация, 4%
OOO Zhurnal "Mendeleevskie Soobshcheniya"
1 публикация, 4%
American Chemical Society (ACS)
1 публикация, 4%
The Technical Association of Photopolymers, Japan
1 публикация, 4%
2
4
6
8
10
12
  • Мы не учитываем публикации, у которых нет DOI.
  • Статистика публикаций обновляется еженедельно.

Вы ученый?

Создайте профиль, чтобы получать персональные рекомендации коллег, конференций и новых статей.
Метрики
25
Поделиться
Цитировать
ГОСТ |
Цитировать
Piao H., McIntyre N. S. High-resolution valence band XPS studies of thin film Au–Al alloys // Journal of Electron Spectroscopy and Related Phenomena. 2001. Vol. 119. No. 1. pp. 29-33.
ГОСТ со всеми авторами (до 50) Скопировать
Piao H., McIntyre N. S. High-resolution valence band XPS studies of thin film Au–Al alloys // Journal of Electron Spectroscopy and Related Phenomena. 2001. Vol. 119. No. 1. pp. 29-33.
RIS |
Цитировать
TY - JOUR
DO - 10.1016/s0368-2048(01)00234-1
UR - https://doi.org/10.1016/s0368-2048(01)00234-1
TI - High-resolution valence band XPS studies of thin film Au–Al alloys
T2 - Journal of Electron Spectroscopy and Related Phenomena
AU - Piao, H.
AU - McIntyre, N. S.
PY - 2001
DA - 2001/07/01
PB - Elsevier
SP - 29-33
IS - 1
VL - 119
SN - 0368-2048
SN - 1873-2526
ER -
BibTex |
Цитировать
BibTex (до 50 авторов) Скопировать
@article{2001_Piao,
author = {H. Piao and N. S. McIntyre},
title = {High-resolution valence band XPS studies of thin film Au–Al alloys},
journal = {Journal of Electron Spectroscopy and Related Phenomena},
year = {2001},
volume = {119},
publisher = {Elsevier},
month = {jul},
url = {https://doi.org/10.1016/s0368-2048(01)00234-1},
number = {1},
pages = {29--33},
doi = {10.1016/s0368-2048(01)00234-1}
}
MLA
Цитировать
Piao, H., and N. S. McIntyre. “High-resolution valence band XPS studies of thin film Au–Al alloys.” Journal of Electron Spectroscopy and Related Phenomena, vol. 119, no. 1, Jul. 2001, pp. 29-33. https://doi.org/10.1016/s0368-2048(01)00234-1.