Phase formation sequence, magnetic and structural development during solid-state reactions in 72Pt/28fcc-Co (001) thin films

The phase formation sequence during the thermally induced solid-state reaction between polycrystalline Pt and epitaxial fcc-Co (001) films in the Pt/fcc-Co(001) bilayers are systematically examined using X-ray diffraction and magnetic measurements. The films have nominal atomic ratio Co:Pt = 28:72 and total thickness 300–400 nm. Annealing to the temperature of 375 °C does not change the structural and magnetic properties of the films; this is indicative of the absence of considerable mixing at the Co/Pt interface. With the subsequent increase of the annealing temperature, the phase formation in the Pt/fcc-Co(001) bilayers has been found to have two temperature (375 °C–575 °C and 575 °C–825 °C) intervals. Solid-state reaction between Pt and Co starts above 375 °C, and nanoclusters containing the ordered L10 phase epitaxially intergrow with the disordered A1 phase of the composition CoPt3 form and exist in the first temperature interval. The distinctive feature of the first interval is the formation of in-plane rotatable magnetic anisotropy. In the second temperature interval, the (L10 + A1) two-phase mixture grows into the ordered L12-CoPt3 phase leading to the disappearance of rotatable anisotropy. Possible origin of the rotatable magnetic anisotropy is discussed. The first magnetocrystalline anisotropy constant of L12-CoPt3 has the maximum value of −5.0·105egr/cm3 and order parameter 0.55 at 675 °C. A careful analysis of thin film solid-state reactions implies the existence of low-temperature transformation (∼375 °C) on the Pt-rich side of the Co-Pt system.