Influence of X-ray irradiation on the optical properties of CoMTPP thin films
Publication type: Journal Article
Publication date: 2011-05-01
scimago Q2
wos Q2
SJR: 0.526
CiteScore: 4.8
Impact factor: 2.5
ISSN: 00304018, 18730310
Electronic, Optical and Magnetic Materials
Physical and Theoretical Chemistry
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering
Abstract
Thin films of 5,10,15,20-Tetrakis (4-methoxyphenyl)-21H,23H-porphine cobalt (II), CoMTPP were prepared at room temperature (300K) by the thermal evaporation technique under vacuum pressure about 2 × 10− 4Pa. The X-ray diffraction patterns showed the amorphous nature for the as-deposited and the irradiated films, whereas the powder has shown a polycrystalline with triclinic structure. Miller's indices, hkl, values for each diffraction peak in the XRD spectrum were calculated. Optical properties of CoMTPP thin films were characterized by using spectrophotometric measurements of transmittance and reflectance in the spectral range from 200 to 2500 nm. The refractive index, n, and the absorption index, k, were calculated. The obtained data were used to estimate the type of transitions and the optical and fundamental gaps before and after X-ray irradiation. In addition, the normal dispersion of the refractive index is discussed in terms of lorentz-lorentz free single oscillator model and modified lorentz Drude model of free carrier contribution.
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El-Nahass M. M. et al. Influence of X-ray irradiation on the optical properties of CoMTPP thin films // Optics Communications. 2011. Vol. 284. No. 9. pp. 2259-2263.
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El-Nahass M. M., Ammar A., Atta A. A., FARAG A. A. M., Zaidia E. E. Influence of X-ray irradiation on the optical properties of CoMTPP thin films // Optics Communications. 2011. Vol. 284. No. 9. pp. 2259-2263.
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TY - JOUR
DO - 10.1016/j.optcom.2010.12.032
UR - https://doi.org/10.1016/j.optcom.2010.12.032
TI - Influence of X-ray irradiation on the optical properties of CoMTPP thin films
T2 - Optics Communications
AU - El-Nahass, M. M.
AU - Ammar, A.H.
AU - Atta, A. A.
AU - FARAG, A. A. M.
AU - Zaidia, E.F.M. El
PY - 2011
DA - 2011/05/01
PB - Elsevier
SP - 2259-2263
IS - 9
VL - 284
SN - 0030-4018
SN - 1873-0310
ER -
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BibTex (up to 50 authors)
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@article{2011_El-Nahass,
author = {M. M. El-Nahass and A.H. Ammar and A. A. Atta and A. A. M. FARAG and E.F.M. El Zaidia},
title = {Influence of X-ray irradiation on the optical properties of CoMTPP thin films},
journal = {Optics Communications},
year = {2011},
volume = {284},
publisher = {Elsevier},
month = {may},
url = {https://doi.org/10.1016/j.optcom.2010.12.032},
number = {9},
pages = {2259--2263},
doi = {10.1016/j.optcom.2010.12.032}
}
Cite this
MLA
Copy
El-Nahass, M. M., et al. “Influence of X-ray irradiation on the optical properties of CoMTPP thin films.” Optics Communications, vol. 284, no. 9, May. 2011, pp. 2259-2263. https://doi.org/10.1016/j.optcom.2010.12.032.