Influence of structural arrangement of R2O2 slabs of layered cuprates on high-temperature properties important for application in IT-SOFC

article i nfo Layered cuprates Pr2 − xSrxCuO4-δwith T* (x = 0.3, 0.4) and T (x = 1.0, 1.3) structures were prepared in air at 1273- 1373 K. Oxygen content (4 − δ) of the as-prepared phases decreases from 3.96 (x = 0.3) and 3.98 (x = 0.4) to 3.69 (x = 1.0) and 3.49 (x = 1.3), respectively, as determined by chemical titration. Dilatometry measurements revealed non-linear expansion with low- and high-temperature regions occurring due to thermogravimetrically detected oxygen loss. Different expansion behaviors in low- and high-temperature regions of T- and T*-phases are attributed to various distributions of oxygen vacancies in their crystal structures. Both x = 0.4 and 1.0 ceramic samples exhibit lower conductivity values at high temperatures in comparison with undoped Pr2CuO4. The temperature depen- dences of the electrical conductivity at variable oxygen partial pressure (pO2 =1 0 −4 -0.21 atm) reveal different mechanisms of the holes generation in x = 0.4 and 1.0 compounds. The tracer diffusion coefficient of oxygen (DT )i n Pr1.6Sr0.4CuO3.98 determined by isotopic exchange depth profile (IEDP) technique using secondary ion mass spectrometry (SIMS) is in the range 6.7 × 10 −10