Control of radiation damage in the TEM

Тип публикации: Journal Article

Дата публикации: 2013-04-01

Elsevier

Ultramicroscopy

scimago Q2

wos Q3

БС1

SJR: 0.716

CiteScore: 4.1

Impact factor: 2

ISSN: 03043991, 18792723

DOI: 10.1016/j.ultramic.2012.07.006

Скопировать DOI

PubMed ID: 22910614

Electronic, Optical and Magnetic Materials

Atomic and Molecular Physics, and Optics

Instrumentation

Краткое описание

The problem of electron-beam damage in the transmission electron microscope is reviewed, with an emphasis on radiolysis processes in soft materials and organic specimens. Factors that determine the dose-limited resolution are identified for three different operational modes: bright-field scattering-contrast, phase-contrast and dark-field microscopy. Methods of reducing radiation damage are discussed, including low-dose techniques, cooling or encapsulating the specimen, and the choice of imaging mode, incident-beam diameter and incident-electron energy. Further experiments are suggested as a means of obtaining a better understanding and control of electron-beam damage.

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