Giant Asymmetry of Domain Walls Propagation in Pd/Co/Pd(111) Epitaxial Structures with Different Interface Roughness
A. V. Davydenko
1
,
Aleksei G Kozlov
1
,
A. G. Kozlov
1
,
Nikolay N. Chernousov
1
,
Aleksandr A. Turpak
1
,
Konstantin S Ermakov
1
,
Maksim E. Stebliy
1
,
Michail E Letushev
1
,
Alexandr V. Sadovnikov
1, 2
,
Aleksey P Golikov
3
,
Alexey V. Ognev
1, 4
,
Y. Shiota
5
,
Teruo ONO
5, 6, 7
,
Toshimi OHNO
5, 6, 7
,
Тип публикации: Journal Article
Дата публикации: 2024-02-19
scimago Q1
wos Q2
БС1
SJR: 1.045
CiteScore: 7.4
Impact factor: 4.7
ISSN: 26376113
Materials Chemistry
Electronic, Optical and Magnetic Materials
Electrochemistry
Краткое описание
The motion of domain walls (DWs) in magnetic nanoscale layered systems attracts a great deal of attention due to the possible chiral nature of the energy dissipation occurring because of the presence of strong spin–orbit coupling and the broken inversion symmetry. Here, we report on a giant asymmetry of DWs propagation in the creep regime in the Pd/Co/Pd epitaxial system under the influence of driving out-of-plane (OOP) and symmetry breaking in-plane (IP) magnetic fields. With an increase in the thickness of the bottom Pd layer, which in turn leads to growth of the interface roughness of the Pd/Co/Pd samples, the asymmetry of DWs propagation increases. The maximal reliably measured relation of the velocities of right-handed and left-handed propagating DWs in the Pd(12.5)/Co(0.7)/Pd(3) sample, where thickness is in nanometers, is equal to 6600, which means almost complete blocking of the propagation of DWs in the direction determined by the appropriate choice of a combination of the applied magnetic fields. The observed giant asymmetry of the propagation of DWs indicates the importance of nanoengineering the parameters of the interfaces to control the propagation of DWs in magnetic memory and logic devices.
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Davydenko A. V. et al. Giant Asymmetry of Domain Walls Propagation in Pd/Co/Pd(111) Epitaxial Structures with Different Interface Roughness // ACS Applied Electronic Materials. 2024. Vol. 6. No. 2. pp. 1094-1103.
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Davydenko A. V., Kozlov A. G., Kozlov A. G., Chernousov N. N., Turpak A. A., Ermakov K. S., Stebliy M. E., Letushev M. E., Sadovnikov A. V., Golikov A. P., Ognev A. V., Shiota Y., ONO T., OHNO T., Samardak A. S. Giant Asymmetry of Domain Walls Propagation in Pd/Co/Pd(111) Epitaxial Structures with Different Interface Roughness // ACS Applied Electronic Materials. 2024. Vol. 6. No. 2. pp. 1094-1103.
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TY - JOUR
DO - 10.1021/acsaelm.3c01480
UR - https://pubs.acs.org/doi/10.1021/acsaelm.3c01480
TI - Giant Asymmetry of Domain Walls Propagation in Pd/Co/Pd(111) Epitaxial Structures with Different Interface Roughness
T2 - ACS Applied Electronic Materials
AU - Davydenko, A. V.
AU - Kozlov, Aleksei G
AU - Kozlov, A. G.
AU - Chernousov, Nikolay N.
AU - Turpak, Aleksandr A.
AU - Ermakov, Konstantin S
AU - Stebliy, Maksim E.
AU - Letushev, Michail E
AU - Sadovnikov, Alexandr V.
AU - Golikov, Aleksey P
AU - Ognev, Alexey V.
AU - Shiota, Y.
AU - ONO, Teruo
AU - OHNO, Toshimi
AU - Samardak, Alexander S.
PY - 2024
DA - 2024/02/19
PB - American Chemical Society (ACS)
SP - 1094-1103
IS - 2
VL - 6
SN - 2637-6113
ER -
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@article{2024_Davydenko,
author = {A. V. Davydenko and Aleksei G Kozlov and A. G. Kozlov and Nikolay N. Chernousov and Aleksandr A. Turpak and Konstantin S Ermakov and Maksim E. Stebliy and Michail E Letushev and Alexandr V. Sadovnikov and Aleksey P Golikov and Alexey V. Ognev and Y. Shiota and Teruo ONO and Toshimi OHNO and Alexander S. Samardak},
title = {Giant Asymmetry of Domain Walls Propagation in Pd/Co/Pd(111) Epitaxial Structures with Different Interface Roughness},
journal = {ACS Applied Electronic Materials},
year = {2024},
volume = {6},
publisher = {American Chemical Society (ACS)},
month = {feb},
url = {https://pubs.acs.org/doi/10.1021/acsaelm.3c01480},
number = {2},
pages = {1094--1103},
doi = {10.1021/acsaelm.3c01480}
}
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Davydenko, A. V., et al. “Giant Asymmetry of Domain Walls Propagation in Pd/Co/Pd(111) Epitaxial Structures with Different Interface Roughness.” ACS Applied Electronic Materials, vol. 6, no. 2, Feb. 2024, pp. 1094-1103. https://pubs.acs.org/doi/10.1021/acsaelm.3c01480.