volume 58 issue 43 pages 20109-20115

Ultralow Thermal Resistance across the Solid–Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer

Publication typeJournal Article
Publication date2019-10-04
scimago Q1
wos Q2
SJR0.828
CiteScore6.7
Impact factor3.9
ISSN08885885, 15205045
General Chemistry
General Chemical Engineering
Industrial and Manufacturing Engineering
Abstract
The understanding and regulation of thermal transport across the solid-liquid interface, especially the electrical double layer (EDL) formed by ionic liquid (IL), is significant for the reasonable design of the efficient thermal dissipation capabilities in the field of chemical engineering. In the present work, by large-scale molecular dynamics simulation method, we reveal that rather than the strong solid-liquid interaction, the atomic structure of EDL dominates the entire interfacial thermal transport across solid-IL interfaces. The simulation results show that as the surface charge increases, interfacial thermal resistance (ITR) will decrease in two stages, sharp firstly and then slowly. Two-dimensional structure factors, geometry state of cation, and solid-liquid interfacial energy for different surface charge demonstrate that the evaluation of EDL agrees well with the trend of ITR. Furthermore, the vibrational spectrum and frequency-dependent heat flow also indicate that the high ordered EDL will enh...
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GOST Copy
Qian C. et al. Ultralow Thermal Resistance across the Solid–Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer // Industrial & Engineering Chemistry Research. 2019. Vol. 58. No. 43. pp. 20109-20115.
GOST all authors (up to 50) Copy
Qian C., Ding B., Wu Z., Ding W. L., Huo F., He H., Wei N., Wang Y., Zhang X. Ultralow Thermal Resistance across the Solid–Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer // Industrial & Engineering Chemistry Research. 2019. Vol. 58. No. 43. pp. 20109-20115.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1021/acs.iecr.9b04480
UR - https://doi.org/10.1021/acs.iecr.9b04480
TI - Ultralow Thermal Resistance across the Solid–Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer
T2 - Industrial & Engineering Chemistry Research
AU - Qian, Cheng
AU - Ding, Bin
AU - Wu, Zhiwei
AU - Ding, Wei Lu
AU - Huo, Feng
AU - He, Hongyan
AU - Wei, Ning
AU - Wang, Yanlei
AU - Zhang, Xiangping
PY - 2019
DA - 2019/10/04
PB - American Chemical Society (ACS)
SP - 20109-20115
IS - 43
VL - 58
SN - 0888-5885
SN - 1520-5045
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2019_Qian,
author = {Cheng Qian and Bin Ding and Zhiwei Wu and Wei Lu Ding and Feng Huo and Hongyan He and Ning Wei and Yanlei Wang and Xiangping Zhang},
title = {Ultralow Thermal Resistance across the Solid–Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer},
journal = {Industrial & Engineering Chemistry Research},
year = {2019},
volume = {58},
publisher = {American Chemical Society (ACS)},
month = {oct},
url = {https://doi.org/10.1021/acs.iecr.9b04480},
number = {43},
pages = {20109--20115},
doi = {10.1021/acs.iecr.9b04480}
}
MLA
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MLA Copy
Qian, Cheng, et al. “Ultralow Thermal Resistance across the Solid–Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer.” Industrial & Engineering Chemistry Research, vol. 58, no. 43, Oct. 2019, pp. 20109-20115. https://doi.org/10.1021/acs.iecr.9b04480.