Nano Letters, volume 23, issue 6, pages 2087-2093
Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence
Ivan Yu. Eremchev
1, 2
,
Aleksandr O. Tarasevich
1, 2, 3
,
Maria A. Kniazeva
1, 2, 3
,
Jun Li
4
,
Andrey V. Naumov
1, 2
,
Publication type: Journal Article
Publication date: 2023-03-09
Journal:
Nano Letters
Quartile SCImago
Q1
Quartile WOS
Q1
Impact factor: 10.8
ISSN: 15306984, 15306992
PubMed ID:
36893363
General Chemistry
Condensed Matter Physics
General Materials Science
Mechanical Engineering
Bioengineering
Top-30
Citations by journals
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1
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JETP Letters
1 publication, 33.33%
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ACS applied materials & interfaces
1 publication, 33.33%
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Russian Chemical Reviews
1 publication, 33.33%
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1
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Citations by publishers
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1
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Pleiades Publishing
1 publication, 33.33%
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American Chemical Society (ACS)
1 publication, 33.33%
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Autonomous Non-profit Organization Editorial Board of the journal Uspekhi Khimii
1 publication, 33.33%
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1
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- We do not take into account publications without a DOI.
- Statistics recalculated only for publications connected to researchers, organizations and labs registered on the platform.
- Statistics recalculated weekly.
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Eremchev I. Y. et al. Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence // Nano Letters. 2023. Vol. 23. No. 6. pp. 2087-2093.
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Eremchev I. Y., Tarasevich A. O., Kniazeva M. A., Li J., Naumov A. V., Scheblykin I. Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence // Nano Letters. 2023. Vol. 23. No. 6. pp. 2087-2093.
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TY - JOUR
DO - 10.1021/acs.nanolett.2c04004
UR - https://pubs.acs.org/doi/10.1021/acs.nanolett.2c04004
TI - Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence
T2 - Nano Letters
AU - Eremchev, Ivan Yu.
AU - Tarasevich, Aleksandr O.
AU - Kniazeva, Maria A.
AU - Li, Jun
AU - Naumov, Andrey V.
AU - Scheblykin, I.G
PY - 2023
DA - 2023/03/09 00:00:00
PB - American Chemical Society (ACS)
SP - 2087-2093
IS - 6
VL - 23
PMID - 36893363
SN - 1530-6984
SN - 1530-6992
ER -
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@article{2023_Eremchev,
author = {Ivan Yu. Eremchev and Aleksandr O. Tarasevich and Maria A. Kniazeva and Jun Li and Andrey V. Naumov and I.G Scheblykin},
title = {Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence},
journal = {Nano Letters},
year = {2023},
volume = {23},
publisher = {American Chemical Society (ACS)},
month = {mar},
url = {https://pubs.acs.org/doi/10.1021/acs.nanolett.2c04004},
number = {6},
pages = {2087--2093},
doi = {10.1021/acs.nanolett.2c04004}
}
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Eremchev, Ivan Yu., et al. “Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence.” Nano Letters, vol. 23, no. 6, Mar. 2023, pp. 2087-2093. https://pubs.acs.org/doi/10.1021/acs.nanolett.2c04004.