volume 106 issue 27 pages 6921-6929

Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts

Publication typeJournal Article
Publication date2002-06-19
scimago Q1
wos Q3
SJR0.742
CiteScore5.3
Impact factor2.9
ISSN15206106, 15205207, 10895647
Materials Chemistry
Surfaces, Coatings and Films
Physical and Theoretical Chemistry
Abstract
Copper and copper oxides (Cu2O and CuO) have been deposited by evaporation of copper and subsequent oxidizing treatments, on the surface of flat SiO2 and ZrO2 substrates. Large variations of severa...
Found 
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GOST |
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GOST Copy
Espinós J. P. et al. Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts // Journal of Physical Chemistry B. 2002. Vol. 106. No. 27. pp. 6921-6929.
GOST all authors (up to 50) Copy
Espinós J. P., Herrera Morales J. M., Barranco A., Garcia Caballero A., Holgado J., González-Elipe A. R. Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts // Journal of Physical Chemistry B. 2002. Vol. 106. No. 27. pp. 6921-6929.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1021/jp014618m
UR - https://doi.org/10.1021/jp014618m
TI - Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts
T2 - Journal of Physical Chemistry B
AU - Espinós, J. P.
AU - Herrera Morales, Jorge Mario
AU - Barranco, Angel
AU - Garcia Caballero, Alfonso
AU - Holgado, J.P
AU - González-Elipe, Agustín R.
PY - 2002
DA - 2002/06/19
PB - American Chemical Society (ACS)
SP - 6921-6929
IS - 27
VL - 106
SN - 1520-6106
SN - 1520-5207
SN - 1089-5647
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2002_Espinós,
author = {J. P. Espinós and Jorge Mario Herrera Morales and Angel Barranco and Alfonso Garcia Caballero and J.P Holgado and Agustín R. González-Elipe},
title = {Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts},
journal = {Journal of Physical Chemistry B},
year = {2002},
volume = {106},
publisher = {American Chemical Society (ACS)},
month = {jun},
url = {https://doi.org/10.1021/jp014618m},
number = {27},
pages = {6921--6929},
doi = {10.1021/jp014618m}
}
MLA
Cite this
MLA Copy
Espinós, J. P., et al. “Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts.” Journal of Physical Chemistry B, vol. 106, no. 27, Jun. 2002, pp. 6921-6929. https://doi.org/10.1021/jp014618m.