volume 116 issue 30 pages 16111-16121

Oxidation of Silicon Carbide by O2 and H2O: A ReaxFF Reactive Molecular Dynamics Study, Part I

David A. Newsome 1
Debasis Sengupta 1
Dale N. Lawrence 2
Michael F Russo 2
Publication typeJournal Article
Publication date2012-07-19
scimago Q1
wos Q3
SJR0.914
CiteScore6.2
Impact factor3.2
ISSN19327447, 19327455
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Physical and Theoretical Chemistry
General Energy
Abstract
Simulations of the initial oxidation process of a SiC surface exposed to O2 and H2O molecules was studied with ReaxFF, an atomically detailed reactive molecular dynamics method that naturally models the breaking and forming of bonds. In this work, the ReaxFF forcefield was first expanded by training it with new quantum mechanics data of the binding energy, equation of state, and heat of formation of the SiC crystal, along with data from earlier studies that describes Si – Si, Si – O, and Si – H interactions. This expanded ReaxFF forcefield is capable of simultaneously describing both Si–C–O and Si–O–H bonding interactions. Using the forcefield, oxidation simulations were performed at various temperatures (in the range of 500 to 5000 K), and the trajectories were analyzed. The analyses showed that SiC gradually transforms into the oxides of silicon with simultaneous formation of a graphite-like layer. In presence of excess O2, the graphite-like layer was further oxidized to CO and CO2. We also analyzed the...
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Newsome D. A. et al. Oxidation of Silicon Carbide by O2 and H2O: A ReaxFF Reactive Molecular Dynamics Study, Part I // Journal of Physical Chemistry C. 2012. Vol. 116. No. 30. pp. 16111-16121.
GOST all authors (up to 50) Copy
Newsome D. A., Sengupta D., Lawrence D. N., Russo M. F., Van Duin A. C. Oxidation of Silicon Carbide by O2 and H2O: A ReaxFF Reactive Molecular Dynamics Study, Part I // Journal of Physical Chemistry C. 2012. Vol. 116. No. 30. pp. 16111-16121.
RIS |
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RIS Copy
TY - JOUR
DO - 10.1021/jp306391p
UR - https://doi.org/10.1021/jp306391p
TI - Oxidation of Silicon Carbide by O2 and H2O: A ReaxFF Reactive Molecular Dynamics Study, Part I
T2 - Journal of Physical Chemistry C
AU - Newsome, David A.
AU - Sengupta, Debasis
AU - Lawrence, Dale N.
AU - Russo, Michael F
AU - Van Duin, Adri C.
PY - 2012
DA - 2012/07/19
PB - American Chemical Society (ACS)
SP - 16111-16121
IS - 30
VL - 116
SN - 1932-7447
SN - 1932-7455
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2012_Newsome,
author = {David A. Newsome and Debasis Sengupta and Dale N. Lawrence and Michael F Russo and Adri C. Van Duin},
title = {Oxidation of Silicon Carbide by O2 and H2O: A ReaxFF Reactive Molecular Dynamics Study, Part I},
journal = {Journal of Physical Chemistry C},
year = {2012},
volume = {116},
publisher = {American Chemical Society (ACS)},
month = {jul},
url = {https://doi.org/10.1021/jp306391p},
number = {30},
pages = {16111--16121},
doi = {10.1021/jp306391p}
}
MLA
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Newsome, David A., et al. “Oxidation of Silicon Carbide by O2 and H2O: A ReaxFF Reactive Molecular Dynamics Study, Part I.” Journal of Physical Chemistry C, vol. 116, no. 30, Jul. 2012, pp. 16111-16121. https://doi.org/10.1021/jp306391p.