Journal of Materials Chemistry C, volume 8, issue 9, pages 3113-3119
Metal–2D multilayered semiconductor junctions: layer-number dependent Fermi-level pinning
Qian Wang
1, 2
,
Yangfan Shao Yangfan Shao
1, 3
,
P. L. Gong
1
,
Xingqiang Shi
1
Publication type: Journal Article
Publication date: 2020-01-18
Journal:
Journal of Materials Chemistry C
scimago Q1
SJR: 1.358
CiteScore: 10.8
Impact factor: 5.7
ISSN: 20507526, 20507534
Materials Chemistry
General Chemistry
Abstract
Thickness-dependent performance of metal–two-dimensional semiconductor junctions in electronics/optoelectronics have attracted increasing attention but, currently, little knowledge about the micro-mechanism of this thickness dependence is available.
Found
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