Journal of Materials Chemistry C, volume 8, issue 9, pages 3113-3119

Metal–2D multilayered semiconductor junctions: layer-number dependent Fermi-level pinning

Publication typeJournal Article
Publication date2020-01-18
scimago Q1
SJR1.358
CiteScore10.8
Impact factor5.7
ISSN20507526, 20507534
Materials Chemistry
General Chemistry
Abstract

Thickness-dependent performance of metal–two-dimensional semiconductor junctions in electronics/optoelectronics have attracted increasing attention but, currently, little knowledge about the micro-mechanism of this thickness dependence is available.

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