CrystEngComm, volume 22, issue 2, pages 283-292
Structural and optical characterization of dilute phosphide planar heterostructures with high nitrogen content on silicon
Koval Olga Yu
1
,
Kirilenko D.A.
2, 3
,
Pirogov Evgeniy V
1
,
Filosofov Nikolay G
4
,
Serov Aleksei Yu
4
,
Shtrom I V
1, 4
,
Mukhin Ivan S.
1, 2
Publication type: Journal Article
Publication date: 2020-01-01
General Chemistry
Condensed Matter Physics
General Materials Science
Abstract
Despite poor crystallinity, a dilute nitride phosphide heterostructure with 5% nitrogen content demonstrates PL response at RT centered at 1.76 eV.
Citations by journals
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1
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Nanomaterials
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Nanomaterials
1 publication, 12.5%
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ACS Applied Nano Materials
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ACS Applied Nano Materials
1 publication, 12.5%
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Bulletin of Materials Science
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Bulletin of Materials Science
1 publication, 12.5%
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Journal of Physics: Conference Series
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Journal of Physics: Conference Series
1 publication, 12.5%
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Nanotechnology
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Nanotechnology
1 publication, 12.5%
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Ceramics International
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Ceramics International
1 publication, 12.5%
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Physica Status Solidi (B): Basic Research
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1 publication, 12.5%
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Materials Science in Semiconductor Processing
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Materials Science in Semiconductor Processing
1 publication, 12.5%
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1
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Citations by publishers
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1
2
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IOP Publishing
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IOP Publishing
2 publications, 25%
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Elsevier
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Elsevier
2 publications, 25%
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Multidisciplinary Digital Publishing Institute (MDPI)
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Multidisciplinary Digital Publishing Institute (MDPI)
1 publication, 12.5%
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American Chemical Society (ACS)
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American Chemical Society (ACS)
1 publication, 12.5%
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Springer Nature
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Springer Nature
1 publication, 12.5%
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Wiley
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Wiley
1 publication, 12.5%
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1
2
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- We do not take into account publications that without a DOI.
- Statistics recalculated only for publications connected to researchers, organizations and labs registered on the platform.
- Statistics recalculated weekly.
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Koval O. Yu. et al. Structural and optical characterization of dilute phosphide planar heterostructures with high nitrogen content on silicon // CrystEngComm. 2020. Vol. 22. No. 2. pp. 283-292.
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Koval O. Yu., Fedorov V. V., Kryzhanovskaya N., Sapunov G. A., Kirilenko D., Pirogov E. V., Filosofov N. G., Serov A. Yu., Shtrom I. V., Bolshakov A. P., Mukhin I. S. Structural and optical characterization of dilute phosphide planar heterostructures with high nitrogen content on silicon // CrystEngComm. 2020. Vol. 22. No. 2. pp. 283-292.
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TY - JOUR
DO - 10.1039/c9ce01498e
UR - https://doi.org/10.1039%2Fc9ce01498e
TI - Structural and optical characterization of dilute phosphide planar heterostructures with high nitrogen content on silicon
T2 - CrystEngComm
AU - Koval, Olga Yu
AU - Kryzhanovskaya, Natalia
AU - Sapunov, Georgiy A
AU - Pirogov, Evgeniy V
AU - Filosofov, Nikolay G
AU - Serov, Aleksei Yu
AU - Bolshakov, Alexey P.
AU - Fedorov, Vladimir V
AU - Kirilenko, D.A.
AU - Shtrom, I V
AU - Mukhin, Ivan S.
PY - 2020
DA - 2020/01/01 00:00:00
PB - Royal Society of Chemistry (RSC)
SP - 283-292
IS - 2
VL - 22
SN - 1466-8033
ER -
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@article{2020_Koval,
author = {Olga Yu Koval and Natalia Kryzhanovskaya and Georgiy A Sapunov and Evgeniy V Pirogov and Nikolay G Filosofov and Aleksei Yu Serov and Alexey P. Bolshakov and Vladimir V Fedorov and D.A. Kirilenko and I V Shtrom and Ivan S. Mukhin},
title = {Structural and optical characterization of dilute phosphide planar heterostructures with high nitrogen content on silicon},
journal = {CrystEngComm},
year = {2020},
volume = {22},
publisher = {Royal Society of Chemistry (RSC)},
month = {jan},
url = {https://doi.org/10.1039%2Fc9ce01498e},
number = {2},
pages = {283--292},
doi = {10.1039/c9ce01498e}
}
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Koval, Olga Yu., et al. “Structural and optical characterization of dilute phosphide planar heterostructures with high nitrogen content on silicon.” CrystEngComm, vol. 22, no. 2, Jan. 2020, pp. 283-292. https://doi.org/10.1039%2Fc9ce01498e.