AgBiS2 quantum dot based multilevel resistive switching for low power electronics
1
Academy of Scientific and innovative Research (AcSIR), Ghaziabad 201002, India
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Publication type: Journal Article
Publication date: 2023-07-25
scimago Q1
wos Q1
SJR: 1.220
CiteScore: 9.3
Impact factor: 5.1
ISSN: 20507526, 20507534
Materials Chemistry
General Chemistry
Abstract
In the ever-expanding digital landscape, efficient solutions are needed that offer mass-producible, high-density, and low-power data storage capabilities to fulfill the growing demand for data storage. Memristive devices incorporating solution-processable metal chalcogenide quantum dots (QDs) have emerged as a viable solution within this framework. In this study, solution-processed ternary metal chalcogenide AgBiS2 QDs are used as a functional layer via spin-coating method in a memristive device featuring an Al/AgBiS2/ITO configuration. AgBiS2 QDs of ∼6 nm size are synthesized using a hot injection method. The cubic structure of AgBiS2 has been confirmed by X-ray diffraction (XRD). The Al/AgBiS2/ITO device exhibits an electroforming free bipolar resistive switching (RS) behavior at low switching voltages of +0.3 V/−0.25 V. The endurance of the device has also been demonstrated for up to 500 cycles for +0.7 V/−0.7 V (set/reset) of 100 ms pulse signals. During the set process, a remarkably low power consumption of ∼0.065 mW was observed. The formation of a conductive filament (CF) was proposed as the working mechanism of the device. The migration of electrochemically active Ag metal ions and the sulfur vacancies has been associated with the formation of a CF. The contribution of sulfur vacancies to the filament formation is substantiated by the temperature-dependent resistance of the low resistance state (LRS). The mechanism has also been explained via an energy band diagram. Furthermore, multiple quantum conductance (QC) levels of 1G0, 1.5G0, 3G0, 4G0, and 5G0 have been established by controlling the compliance current (CC) during the set process. The appearance of multiple QC-levels has been ascribed to the ballistic electron transport occurring within an atomic-size filament, wherein the lateral size of the filament increases in response to higher CC. These characteristics make the device suitable for ultra-high dense multi-level memory applications with low power consumption.
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Total citations:
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Citations from 2024:
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(100%)
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Sharma H. et al. AgBiS2 quantum dot based multilevel resistive switching for low power electronics // Journal of Materials Chemistry C. 2023. Vol. 11. No. 33. pp. 11392-11398.
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Sharma H., Saini N., Kumar A., Singh A. AgBiS2 quantum dot based multilevel resistive switching for low power electronics // Journal of Materials Chemistry C. 2023. Vol. 11. No. 33. pp. 11392-11398.
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RIS
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TY - JOUR
DO - 10.1039/d3tc01050c
UR - https://xlink.rsc.org/?DOI=D3TC01050C
TI - AgBiS2 quantum dot based multilevel resistive switching for low power electronics
T2 - Journal of Materials Chemistry C
AU - Sharma, Harshit
AU - Saini, Nitish
AU - Kumar, A.
AU - Singh, Archana
PY - 2023
DA - 2023/07/25
PB - Royal Society of Chemistry (RSC)
SP - 11392-11398
IS - 33
VL - 11
SN - 2050-7526
SN - 2050-7534
ER -
Cite this
BibTex (up to 50 authors)
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@article{2023_Sharma,
author = {Harshit Sharma and Nitish Saini and A. Kumar and Archana Singh},
title = {AgBiS2 quantum dot based multilevel resistive switching for low power electronics},
journal = {Journal of Materials Chemistry C},
year = {2023},
volume = {11},
publisher = {Royal Society of Chemistry (RSC)},
month = {jul},
url = {https://xlink.rsc.org/?DOI=D3TC01050C},
number = {33},
pages = {11392--11398},
doi = {10.1039/d3tc01050c}
}
Cite this
MLA
Copy
Sharma, Harshit, et al. “AgBiS2 quantum dot based multilevel resistive switching for low power electronics.” Journal of Materials Chemistry C, vol. 11, no. 33, Jul. 2023, pp. 11392-11398. https://xlink.rsc.org/?DOI=D3TC01050C.