Applied Physics Letters, volume 70, issue 21, pages 2888-2890

Properties of strained (In, Ga, Al)As lasers with laterally modulated active region

N. N. LEDENTSOV 1
D. BIMBERG 1
Yu.M. Shernyakov 2
V Kochnev 2
A.V. Sakharov 2
I.L. Krestnikov 2
A. Yu, EGOROV 2
A. E. ZHUKOV 2
A. F. TSATSUL'NIKOV 2
B.V. Volovik 2
V. M. Ustinov 2
P. S. KOP'EV 2
Zh. I. Alferov 2
A. O. Kosogov 3
P. Werner 3
Show full list: 16 authors
Publication typeJournal Article
Publication date1997-05-26
scimago Q1
wos Q2
SJR0.976
CiteScore6.4
Impact factor3.5
ISSN00036951, 10773118
Physics and Astronomy (miscellaneous)
Abstract

Transmission electron microscopy studies of low indium composition InxGa1−xAs insertions (x<0.4) in a GaAs matrix deposited by molecular beam epitaxy or by metal-organic chemical vapor deposition reveal nanoscale quasiperiodic compositional and morphological modulations. The luminescence peak wavelength is found to be a strong function of deposition parameters and can be tuned from 1.1 to 1.3 μm for the same x and average thickness of the deposit. Strained (In, Ga, Al)As lasers with such a laterally modulated InxGa1−xAs active region demonstrate significant depolarization of the electroluminescence. For short cavity length, lasing occurs at energies corresponding to transitions between InxGa1−xAs conduction band and light holelike valence band states. Devices lase at low threshold current densities and demonstrate continuous wave operation up to 3 W at room temperature.

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