Applied Physics Letters

, volume 103 , issue 7 , pages 72601

Fluctuations from edge defects in superconducting resonators

C Neill ¹

A. Megrant ¹

R. Barends ¹

Yu Chen ¹

B. Chiaro ¹

J. Kelly ¹

J. Y. Mutus ¹

P. J. J. O’Malley ¹

D. Sank ¹

J. Wenner ¹

T.C. White ¹

Yi Yin ¹

A N Cleland ^{1, 2}

John M. Martinis ^{1, 2}

Hide authors affiliations Show authors affiliations: 2 affiliations

Department of Physics, University of California 1 , Santa Barbara, California 93106, USA |

California NanoSystems Institute, University of California 2 , Santa Barbara, California 93106, USA |

Publication type: Journal Article

Publication date: 2013-08-12

AIP Publishing

Applied Physics Letters

scimago Q1

wos Q2

SJR: 0.896

CiteScore: 6.1

Impact factor: 3.6

ISSN: 00036951, 10773118

DOI: 10.1063/1.4818710

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Physics and Astronomy (miscellaneous)

Abstract

Superconducting resonators, used in astronomy and quantum computation, couple strongly to microscopic two-level defects. We monitor the microwave response of superconducting resonators and observe fluctuations in dissipation and resonance frequency. We present a unified model where the observed dissipative and dispersive effects can be explained as originating from a bath of fluctuating two-level systems. From these measurements, we quantify the number and distribution of the defects.

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GOST |

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GOST Copy

Neill C. et al. Fluctuations from edge defects in superconducting resonators // Applied Physics Letters. 2013. Vol. 103. No. 7. p. 72601.

GOST all authors (up to 50) Copy

Neill C., Megrant A., Barends R., Chen Yu., Chiaro B., Kelly J., Mutus J., O’Malley P., Sank D., Wenner J., White T., Yin Y., Cleland A. N., Martinis J. M. Fluctuations from edge defects in superconducting resonators // Applied Physics Letters. 2013. Vol. 103. No. 7. p. 72601.

RIS |

Cite this

RIS Copy

TY - JOUR

DO - 10.1063/1.4818710

UR - https://doi.org/10.1063/1.4818710

TI - Fluctuations from edge defects in superconducting resonators

T2 - Applied Physics Letters

AU - Neill, C

AU - Megrant, A.

AU - Barends, R.

AU - Chen, Yu

AU - Chiaro, B.

AU - Kelly, J.

AU - Mutus, J. Y.

AU - O’Malley, P. J. J.

AU - Sank, D.

AU - Wenner, J.

AU - White, T.C.

AU - Yin, Yi

AU - Cleland, A N

AU - Martinis, John M.

PY - 2013

DA - 2013/08/12

PB - AIP Publishing

SP - 72601

IS - 7

VL - 103

SN - 0003-6951

SN - 1077-3118

ER -

BibTex |

Cite this

BibTex (up to 50 authors) Copy

@article{2013_Neill,

author = {C Neill and A. Megrant and R. Barends and Yu Chen and B. Chiaro and J. Kelly and J. Y. Mutus and P. J. J. O’Malley and D. Sank and J. Wenner and T.C. White and Yi Yin and A N Cleland and John M. Martinis},

title = {Fluctuations from edge defects in superconducting resonators},

journal = {Applied Physics Letters},

year = {2013},

volume = {103},

publisher = {AIP Publishing},

month = {aug},

url = {https://doi.org/10.1063/1.4818710},

number = {7},

pages = {72601},

doi = {10.1063/1.4818710}

}

MLA

Cite this

MLA Copy

Neill, C., et al. “Fluctuations from edge defects in superconducting resonators.” Applied Physics Letters, vol. 103, no. 7, Aug. 2013, p. 72601. https://doi.org/10.1063/1.4818710.

Publisher

AIP Publishing

Journal

Applied Physics Letters

scimago Q1

wos Q2

SJR

0.896

CiteScore

6.1

Impact factor

3.6

ISSN

00036951 (Print)

10773118 (Electronic)

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