Charge transport in dielectrics via tunneling between traps
1
Institute of Automation and Autometry SB RAS 1 , Novosibirsk 630090, Russia
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Publication type: Journal Article
Publication date: 2011-05-01
scimago Q2
wos Q3
SJR: 0.580
CiteScore: 5.1
Impact factor: 2.5
ISSN: 00218979, 10897550
General Physics and Astronomy
Abstract
A theory for charge transport in dielectrics via tunneling between traps was developed. Unlike in the Frenkel model, in the present theory the traps are characterized with the thermal and optical ionization energies, and ionization proceeds by the multi-phonon mechanism. The theory predicts the tunneling between such traps to be a thermally stimulated process whose activation energy equals half to the difference between the optical and thermal ionization energies. The theory provides an adequate description to the experimental current-voltage characteristics of silicon-rich silicon nitride films. Such films have a high density of traps originating from the excess silicon present in the material, with charge transport proceeding as a charge carriers tunnel between closely spaced traps.
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84
Total citations:
84
Citations from 2025:
9
(10.71%)
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GOST
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Nasyrov K. A., Gritsenko V. Charge transport in dielectrics via tunneling between traps // Journal of Applied Physics. 2011. Vol. 109. No. 9. p. 93705.
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Nasyrov K. A., Gritsenko V. Charge transport in dielectrics via tunneling between traps // Journal of Applied Physics. 2011. Vol. 109. No. 9. p. 93705.
Cite this
RIS
Copy
TY - JOUR
DO - 10.1063/1.3587452
UR - https://doi.org/10.1063/1.3587452
TI - Charge transport in dielectrics via tunneling between traps
T2 - Journal of Applied Physics
AU - Nasyrov, K A
AU - Gritsenko, V.A.
PY - 2011
DA - 2011/05/01
PB - AIP Publishing
SP - 93705
IS - 9
VL - 109
SN - 0021-8979
SN - 1089-7550
ER -
Cite this
BibTex (up to 50 authors)
Copy
@article{2011_Nasyrov,
author = {K A Nasyrov and V.A. Gritsenko},
title = {Charge transport in dielectrics via tunneling between traps},
journal = {Journal of Applied Physics},
year = {2011},
volume = {109},
publisher = {AIP Publishing},
month = {may},
url = {https://doi.org/10.1063/1.3587452},
number = {9},
pages = {93705},
doi = {10.1063/1.3587452}
}
Cite this
MLA
Copy
Nasyrov, K. A., and V.A. Gritsenko. “Charge transport in dielectrics via tunneling between traps.” Journal of Applied Physics, vol. 109, no. 9, May. 2011, p. 93705. https://doi.org/10.1063/1.3587452.