Applied Physics Letters

, volume 102 , issue 6 , pages 62405

High resolution switching magnetization magnetic force microscopy

V. Cambel ¹

M Precner ¹

J. Fedor ¹

J. Šoltýs ¹

J Tóbik ¹

T Ščepka ¹

G Karapetrov ^{1, 2}

Hide authors affiliations Show authors affiliations: 2 affiliations

Institute of Electrical Engineering, Slovak Academy of Sciences 1 , Dubravska cesta 9, 841 04 Bratislava, Slovakia |

Department of Physics, Drexel University 2 , 3141 Chestnut Street, Philadelphia, Pennsylvania 19104, USA |

Publication type: Journal Article

Publication date: 2013-02-11

AIP Publishing

Applied Physics Letters

scimago Q1

wos Q2

SJR: 0.896

CiteScore: 6.1

Impact factor: 3.6

ISSN: 00036951, 10773118

DOI: 10.1063/1.4791591

Copy DOI

Physics and Astronomy (miscellaneous)

Abstract

We introduce switching magnetization magnetic force microscopy based on two-pass scanning atomic force microscopy with reversed tip magnetization between the scans. Within this approach the sum of the scanned data with reversed tip magnetization depicts local van der Waals forces, while their differences map the local magnetic forces. Here we implement this method by fabricating low-momentum magnetic probes that exhibit magnetic single domain state, which can be easily reversed in low external field during the scanning. Measurements on high-density parallel and perpendicular magnetic recording media show enhanced spatial resolution of magnetization.

Found

Top-30

Journals

	1 2 3
Nanotechnology	Nanotechnology, 3, 17.65% Nanotechnology 3 publications, 17.65%
Journal of Applied Physics	Journal of Applied Physics, 2, 11.76% Journal of Applied Physics 2 publications, 11.76%
Applied Physics Letters	Applied Physics Letters, 2, 11.76% Applied Physics Letters 2 publications, 11.76%
Nanoscale	Nanoscale, 2, 11.76% Nanoscale 2 publications, 11.76%
Scientific Reports	Scientific Reports, 1, 5.88% Scientific Reports 1 publication, 5.88%
ACS applied materials & interfaces	ACS applied materials & interfaces, 1, 5.88% ACS applied materials & interfaces 1 publication, 5.88%
Physical Chemistry Chemical Physics	Physical Chemistry Chemical Physics, 1, 5.88% Physical Chemistry Chemical Physics 1 publication, 5.88%
Acta Physica Polonica A	Acta Physica Polonica A, 1, 5.88% Acta Physica Polonica A 1 publication, 5.88%
Materials Science-Poland	Materials Science-Poland, 1, 5.88% Materials Science-Poland 1 publication, 5.88%
IEEE Sensors Journal	IEEE Sensors Journal, 1, 5.88% IEEE Sensors Journal 1 publication, 5.88%
Physical Review Materials	Physical Review Materials, 1, 5.88% Physical Review Materials 1 publication, 5.88%
Mesoscience and Nanotechnology	Mesoscience and Nanotechnology, 1, 5.88% Mesoscience and Nanotechnology 1 publication, 5.88%
	1 2 3

Publishers

	1 2 3 4
AIP Publishing	AIP Publishing, 4, 23.53% AIP Publishing 4 publications, 23.53%
IOP Publishing	IOP Publishing, 3, 17.65% IOP Publishing 3 publications, 17.65%
Royal Society of Chemistry (RSC)	Royal Society of Chemistry (RSC), 3, 17.65% Royal Society of Chemistry (RSC) 3 publications, 17.65%
Springer Nature	Springer Nature, 1, 5.88% Springer Nature 1 publication, 5.88%
American Chemical Society (ACS)	American Chemical Society (ACS), 1, 5.88% American Chemical Society (ACS) 1 publication, 5.88%
Institute of Physics, Polish Academy of Sciences	Institute of Physics, Polish Academy of Sciences, 1, 5.88% Institute of Physics, Polish Academy of Sciences 1 publication, 5.88%
Walter de Gruyter	Walter de Gruyter, 1, 5.88% Walter de Gruyter 1 publication, 5.88%
Institute of Electrical and Electronics Engineers (IEEE)	Institute of Electrical and Electronics Engineers (IEEE), 1, 5.88% Institute of Electrical and Electronics Engineers (IEEE) 1 publication, 5.88%
American Physical Society (APS)	American Physical Society (APS), 1, 5.88% American Physical Society (APS) 1 publication, 5.88%
Treatise	Treatise, 1, 5.88% Treatise 1 publication, 5.88%
	1 2 3 4

We do not take into account publications without a DOI.
Statistics recalculated weekly.

Are you a researcher?

Create a profile to get free access to personal recommendations for colleagues and new articles.

Metrics

Cite this

GOST |

Cite this

GOST Copy

Cambel V. et al. High resolution switching magnetization magnetic force microscopy // Applied Physics Letters. 2013. Vol. 102. No. 6. p. 62405.

GOST all authors (up to 50) Copy

Cambel V., Precner M., Fedor J., Šoltýs J., Tóbik J., Ščepka T., Karapetrov G. High resolution switching magnetization magnetic force microscopy // Applied Physics Letters. 2013. Vol. 102. No. 6. p. 62405.

RIS |

Cite this

RIS Copy

TY - JOUR

DO - 10.1063/1.4791591

UR - https://doi.org/10.1063/1.4791591

TI - High resolution switching magnetization magnetic force microscopy

T2 - Applied Physics Letters

AU - Cambel, V.

AU - Precner, M

AU - Fedor, J.

AU - Šoltýs, J.

AU - Tóbik, J

AU - Ščepka, T

AU - Karapetrov, G

PY - 2013

DA - 2013/02/11

PB - AIP Publishing

SP - 62405

IS - 6

VL - 102

SN - 0003-6951

SN - 1077-3118

ER -

BibTex |

Cite this

BibTex (up to 50 authors) Copy

@article{2013_Cambel,

author = {V. Cambel and M Precner and J. Fedor and J. Šoltýs and J Tóbik and T Ščepka and G Karapetrov},

title = {High resolution switching magnetization magnetic force microscopy},

journal = {Applied Physics Letters},

year = {2013},

volume = {102},

publisher = {AIP Publishing},

month = {feb},

url = {https://doi.org/10.1063/1.4791591},

number = {6},

pages = {62405},

doi = {10.1063/1.4791591}

}

MLA

Cite this

MLA Copy

Cambel, V., et al. “High resolution switching magnetization magnetic force microscopy.” Applied Physics Letters, vol. 102, no. 6, Feb. 2013, p. 62405. https://doi.org/10.1063/1.4791591.

Publisher

AIP Publishing

Journal

Applied Physics Letters

scimago Q1

wos Q2

SJR

0.896

CiteScore

6.1

Impact factor

3.6

ISSN

00036951 (Print)

10773118 (Electronic)

Profiles

Goran Karapetrov