Applied Physics Letters

, том 102 , издание 6 , страницы 62405

High resolution switching magnetization magnetic force microscopy

Тип публикации: Journal Article

Дата публикации: 2013-02-11

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Applied Physics Letters

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SJR: 0.856

CiteScore: 6.1

Impact factor: 3.6

ISSN: 00036951, 10773118

DOI: 10.1063/1.4791591

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Physics and Astronomy (miscellaneous)

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We introduce switching magnetization magnetic force microscopy based on two-pass scanning atomic force microscopy with reversed tip magnetization between the scans. Within this approach the sum of the scanned data with reversed tip magnetization depicts local van der Waals forces, while their differences map the local magnetic forces. Here we implement this method by fabricating low-momentum magnetic probes that exhibit magnetic single domain state, which can be easily reversed in low external field during the scanning. Measurements on high-density parallel and perpendicular magnetic recording media show enhanced spatial resolution of magnetization.

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ГОСТ |

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Cambel V. et al. High resolution switching magnetization magnetic force microscopy // Applied Physics Letters. 2013. Vol. 102. No. 6. p. 62405.

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Cambel V., Precner M., Fedor J., Šoltýs J., Tóbik J., Ščepka T., Karapetrov G. High resolution switching magnetization magnetic force microscopy // Applied Physics Letters. 2013. Vol. 102. No. 6. p. 62405.

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TY - JOUR

DO - 10.1063/1.4791591

UR - https://doi.org/10.1063/1.4791591

TI - High resolution switching magnetization magnetic force microscopy

T2 - Applied Physics Letters

AU - Cambel, V.

AU - Precner, M

AU - Fedor, J.

AU - Šoltýs, J.

AU - Tóbik, J

AU - Ščepka, T

AU - Karapetrov, G

PY - 2013

DA - 2013/02/11

PB - AIP Publishing

SP - 62405

IS - 6

VL - 102

SN - 0003-6951

SN - 1077-3118

ER -

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@article{2013_Cambel,

author = {V. Cambel and M Precner and J. Fedor and J. Šoltýs and J Tóbik and T Ščepka and G Karapetrov},

title = {High resolution switching magnetization magnetic force microscopy},

journal = {Applied Physics Letters},

year = {2013},

volume = {102},

publisher = {AIP Publishing},

month = {feb},

url = {https://doi.org/10.1063/1.4791591},

number = {6},

pages = {62405},

doi = {10.1063/1.4791591}

}

MLA

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Cambel, V., et al. “High resolution switching magnetization magnetic force microscopy.” Applied Physics Letters, vol. 102, no. 6, Feb. 2013, p. 62405. https://doi.org/10.1063/1.4791591.

Издатель

AIP Publishing

Журнал

Applied Physics Letters

SCImago Q1

WOS Q2

БС1