Applied Physics Letters

, том 106 , издание 17 , страницы 172903

Thickness-dependent ferroelectric behavior of predominantly (117)-oriented Bi_3.15Nd_0.85Ti₃O₁₂ thin-film capacitors

Тип публикации: Journal Article

Дата публикации: 2015-04-27

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Applied Physics Letters

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SJR: 0.856

CiteScore: 5.8

Impact factor: 3.8

ISSN: 00036951, 10773118

DOI: 10.1063/1.4919566

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Physics and Astronomy (miscellaneous)

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Ferroelectric hysteresis loops, remanent polarization, coercive field, and leakage current characteristics were investigated by increasing the film thickness (from 103 nm to 401 nm) of predominantly (117)-oriented Bi3.15Nd0.85Ti3O12 films. The thickness dependence of the coercive fields shows log coercive field vs. log thickness with a slope of approximately −0.65, which is characteristics of the Kay–Dunn scaling law. The films exhibited very low leakage current on the order of 10−7A/cm2 at an applied electric field of 100 kV/cm. Without a discernible thickness-dependence behavior, the leakage current characteristics, including both Schottky emission and space-charge-limited conduction, were well described by a modified Schottky contact model.

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Yang F. et al. Thickness-dependent ferroelectric behavior of predominantly (117)-oriented Bi3.15Nd0.85Ti3O12 thin-film capacitors // Applied Physics Letters. 2015. Vol. 106. No. 17. p. 172903.

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Yang F., Zhang F., HU G., Zong Z., TANG M. Thickness-dependent ferroelectric behavior of predominantly (117)-oriented Bi3.15Nd0.85Ti3O12 thin-film capacitors // Applied Physics Letters. 2015. Vol. 106. No. 17. p. 172903.

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TY - JOUR

DO - 10.1063/1.4919566

UR - https://doi.org/10.1063/1.4919566

TI - Thickness-dependent ferroelectric behavior of predominantly (117)-oriented Bi3.15Nd0.85Ti3O12 thin-film capacitors

T2 - Applied Physics Letters

AU - Yang, Feng

AU - Zhang, Fuwei

AU - HU, GUANGDA

AU - Zong, Zhihao

AU - TANG, MINGHUA

PY - 2015

DA - 2015/04/27

PB - AIP Publishing

SP - 172903

IS - 17

VL - 106

SN - 0003-6951

SN - 1077-3118

ER -

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@article{2015_Yang,

author = {Feng Yang and Fuwei Zhang and GUANGDA HU and Zhihao Zong and MINGHUA TANG},

title = {Thickness-dependent ferroelectric behavior of predominantly (117)-oriented Bi3.15Nd0.85Ti3O12 thin-film capacitors},

journal = {Applied Physics Letters},

year = {2015},

volume = {106},

publisher = {AIP Publishing},

month = {apr},

url = {https://doi.org/10.1063/1.4919566},

number = {17},

pages = {172903},

doi = {10.1063/1.4919566}

}

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Yang, Feng, et al. “Thickness-dependent ferroelectric behavior of predominantly (117)-oriented Bi3.15Nd0.85Ti3O12 thin-film capacitors.” Applied Physics Letters, vol. 106, no. 17, Apr. 2015, p. 172903. https://doi.org/10.1063/1.4919566.

Издатель

AIP Publishing

Журнал

Applied Physics Letters

SCImago Q1

WOS Q2

БС1