Effect of moisture adsorption on the broadband dielectric response of SiO2-based nanoporous glass
Vadim S Nozdrin
1
,
Arsenii A. Gavdush
1, 2
,
Alexei A Pronin
1
,
Oleg E Porodinkov
1
,
Igor E. Spektor
1
,
Vladimir N Sigaev
3
,
Anton A Mikhailov
3
,
Publication type: Journal Article
Publication date: 2019-12-12
scimago Q2
wos Q3
SJR: 0.580
CiteScore: 5.1
Impact factor: 2.5
ISSN: 00218979, 10897550
General Physics and Astronomy
Abstract
Atmospheric water adsorbed by porous materials may significantly change its electrodynamic response in a wide frequency range. Mechanical and chemical stabilities of silicon dioxide along with a proven manufacturing method of porous SiO2 samples made it convenient for studying the effects of moisture adsorption on various parameters of the porous media. We report the dielectric properties of SiO2-based nanoporous glass in the frequency range of 20 Hz–400 THz at ambient atmospheric conditions and at a low residual pressure of ≤1 mbar. We observed a significant low-frequency dispersion of the complex dielectric permittivity and enhancement of dielectric loss for the porous sample exposed to the ambient moisture. In the terahertz range, the change in dielectric response is smaller and correlates with the moisture saturation of the sample.Atmospheric water adsorbed by porous materials may significantly change its electrodynamic response in a wide frequency range. Mechanical and chemical stabilities of silicon dioxide along with a proven manufacturing method of porous SiO2 samples made it convenient for studying the effects of moisture adsorption on various parameters of the porous media. We report the dielectric properties of SiO2-based nanoporous glass in the frequency range of 20 Hz–400 THz at ambient atmospheric conditions and at a low residual pressure of ≤1 mbar. We observed a significant low-frequency dispersion of the complex dielectric permittivity and enhancement of dielectric loss for the porous sample exposed to the ambient moisture. In the terahertz range, the change in dielectric response is smaller and correlates with the moisture saturation of the sample.
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Total citations:
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Citations from 2024:
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(11.76%)
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GOST
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Komandin G. A. et al. Effect of moisture adsorption on the broadband dielectric response of SiO2-based nanoporous glass // Journal of Applied Physics. 2019. Vol. 126. No. 22. p. 224303.
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Komandin G. A., Nozdrin V. S., Gavdush A. A., Pronin A. A., Porodinkov O. E., Spektor I. E., Sigaev V. N., Mikhailov A. A., Shakhgildyan G. Yu., Ulitko V. E., Abdulaev D. Effect of moisture adsorption on the broadband dielectric response of SiO2-based nanoporous glass // Journal of Applied Physics. 2019. Vol. 126. No. 22. p. 224303.
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RIS
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TY - JOUR
DO - 10.1063/1.5116790
UR - https://doi.org/10.1063/1.5116790
TI - Effect of moisture adsorption on the broadband dielectric response of SiO2-based nanoporous glass
T2 - Journal of Applied Physics
AU - Komandin, Gennady A.
AU - Nozdrin, Vadim S
AU - Gavdush, Arsenii A.
AU - Pronin, Alexei A
AU - Porodinkov, Oleg E
AU - Spektor, Igor E.
AU - Sigaev, Vladimir N
AU - Mikhailov, Anton A
AU - Shakhgildyan, Georgii Yu
AU - Ulitko, Vladislav E.
AU - Abdulaev, Daniil
PY - 2019
DA - 2019/12/12
PB - AIP Publishing
SP - 224303
IS - 22
VL - 126
SN - 0021-8979
SN - 1089-7550
ER -
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BibTex (up to 50 authors)
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@article{2019_Komandin,
author = {Gennady A. Komandin and Vadim S Nozdrin and Arsenii A. Gavdush and Alexei A Pronin and Oleg E Porodinkov and Igor E. Spektor and Vladimir N Sigaev and Anton A Mikhailov and Georgii Yu Shakhgildyan and Vladislav E. Ulitko and Daniil Abdulaev},
title = {Effect of moisture adsorption on the broadband dielectric response of SiO2-based nanoporous glass},
journal = {Journal of Applied Physics},
year = {2019},
volume = {126},
publisher = {AIP Publishing},
month = {dec},
url = {https://doi.org/10.1063/1.5116790},
number = {22},
pages = {224303},
doi = {10.1063/1.5116790}
}
Cite this
MLA
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Komandin, Gennady A., et al. “Effect of moisture adsorption on the broadband dielectric response of SiO2-based nanoporous glass.” Journal of Applied Physics, vol. 126, no. 22, Dec. 2019, p. 224303. https://doi.org/10.1063/1.5116790.