volume 36 issue 28 pages 285201

Electronic transport simulations of Ni/graphene, hBN, MoSe2/Ni vertical junctions

Publication typeJournal Article
Publication date2025-07-09
scimago Q2
wos Q2
SJR0.597
CiteScore6.2
Impact factor2.8
ISSN09574484, 13616528
Abstract

We simulate the electronic and transport properties of metal/two-dimensional material/metal vertical heterostructures, with a focus on graphene, hexagonal boron nitride and two phases of molybdenum diselenide. Using density functional theory and non-equilibrium Green’s function, we assess how stacking configurations and material thickness impact important properties, such as density of states, potential barriers and conductivity. For monolayers, strong orbital hybridization with the metallic electrodes significantly alters the electronic characteristics, with the formation of states within the gap of the semiconducting two-dimensional materials. Trilayers reveal the critical role of interlayer coupling, where the middle layer retains its intrinsic properties, thus influencing the overall conductivity. Our findings highlight the potential for customized multilayer designs to optimize electronic device performance based on two-dimensional materials.

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Bigeard G. et al. Electronic transport simulations of Ni/graphene, hBN, MoSe2/Ni vertical junctions // Nanotechnology. 2025. Vol. 36. No. 28. p. 285201.
GOST all authors (up to 50) Copy
Bigeard G., Kerrami Z., Triozon F., Cresti A. Electronic transport simulations of Ni/graphene, hBN, MoSe2/Ni vertical junctions // Nanotechnology. 2025. Vol. 36. No. 28. p. 285201.
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TY - JOUR
DO - 10.1088/1361-6528/ade9cd
UR - https://iopscience.iop.org/article/10.1088/1361-6528/ade9cd
TI - Electronic transport simulations of Ni/graphene, hBN, MoSe2/Ni vertical junctions
T2 - Nanotechnology
AU - Bigeard, Gaëlle
AU - Kerrami, Z
AU - Triozon, François
AU - Cresti, Alessandro
PY - 2025
DA - 2025/07/09
PB - IOP Publishing
SP - 285201
IS - 28
VL - 36
SN - 0957-4484
SN - 1361-6528
ER -
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@article{2025_Bigeard,
author = {Gaëlle Bigeard and Z Kerrami and François Triozon and Alessandro Cresti},
title = {Electronic transport simulations of Ni/graphene, hBN, MoSe2/Ni vertical junctions},
journal = {Nanotechnology},
year = {2025},
volume = {36},
publisher = {IOP Publishing},
month = {jul},
url = {https://iopscience.iop.org/article/10.1088/1361-6528/ade9cd},
number = {28},
pages = {285201},
doi = {10.1088/1361-6528/ade9cd}
}
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Bigeard, Gaëlle, et al. “Electronic transport simulations of Ni/graphene, hBN, MoSe2/Ni vertical junctions.” Nanotechnology, vol. 36, no. 28, Jul. 2025, p. 285201. https://iopscience.iop.org/article/10.1088/1361-6528/ade9cd.