Superconductor Science and Technology, volume 30, issue 8, pages 84010

Characterisation of amorphous molybdenum silicide (MoSi) superconducting thin films and nanowires

Archan Banerjee ¹

Luke J Baker ¹

Alastair Doye ²

Magnus Nord ²

Robert M Heath ¹

Kleanthis Erotokritou ¹

David Bosworth ³

Zoe H. Barber ³

Ian Maclaren ^{4, 5, 6, 7, 8}

R A HADFIELD ¹

Hide authors affiliations Show authors affiliations: 8 affiliations

Univ Glasgow, University of Glasgow, Sch Engn |

Univ Glasgow, University of Glasgow, Sch Phys & Astron, SUPA |

Univ Cambridge, University of Cambridge |

⁴

SUPA school of Physics and Astronomy

⁵

University Of Glasgow |

⁶

GLASGOW |

⁷

G12 8QQ

⁸

UK |

Publication type: Journal Article

Publication date: 2017-07-12

IOP Publishing

Journal: Superconductor Science and Technology

Quartile SCImago

Quartile WOS

Impact factor: 3.6

ISSN: 09532048, 13616668

DOI: 10.1088/1361-6668/aa76d8

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Materials Chemistry

Metals and Alloys

Ceramics and Composites

Condensed Matter Physics

Electrical and Electronic Engineering

Abstract

We report on the optimisation of amorphous molybdenum silicide thin film growth for superconducting nanowire single photon detector (SNSPD/SSPD) applications. Molybdenum silicide was deposited via co-sputtering from Mo and Si targets in an Ar atmosphere. The superconducting transition temperature (Tc) and sheet resistance (Rs) were measured as a function of thickness and compared to several theoretical models for disordered superconducting films. Superconducting and optical properties of amorphous materials are very sensitive to short- (up to 1 nm) and medium-range order (~1-3 nm) in the atomic structure. Fluctuation electron microscopy (FEM) studies showed that the films assumed an A15-like medium-range order. Electron energy loss spectroscopy (EELS) indicates that the film stoichiometry was close to Mo83Si17, which is consistent with reports that many other A15 structures with the nominal formula A3B show a significant non-stoichiometry with A:B > 3:1. Optical properties from ultraviolet (270 nm) to infrared (2200 nm) wavelengths were measured via spectroscopic ellipsometry for 5 nm thick MoSi films indicating high long wavelength absorption. We also measured the current density as a function of temperature for nanowires patterned from a 10 nm thick MoSi film. The current density at 3.6 K is 3.6 x 105A/cm2 for the widest wire studied (2003 nm), falling to 2 x 105A/cm2 for the narrowest (173 nm). This investigation confirms the excellent suitability of MoSi for SNSPD applications and gives fresh insight into the properties of the underlying materials.

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Citations by journals

	1 2 3 4 5
Physical Review B	Physical Review B, 5, 10% Physical Review B 5 publications, 10%
Superconductor Science and Technology	Superconductor Science and Technology, 5, 10% Superconductor Science and Technology 5 publications, 10%
APL Materials	APL Materials, 2, 4% APL Materials 2 publications, 4%
Applied Physics Letters	Applied Physics Letters, 2, 4% Applied Physics Letters 2 publications, 4%
Physical Review Materials	Physical Review Materials, 2, 4% Physical Review Materials 2 publications, 4%
Thin Solid Films	Thin Solid Films, 2, 4% Thin Solid Films 2 publications, 4%
Microscopy and Microanalysis	Microscopy and Microanalysis, 2, 4% Microscopy and Microanalysis 2 publications, 4%
APL Photonics	APL Photonics, 1, 2% APL Photonics 1 publication, 2%
Nanomaterials	Nanomaterials, 1, 2% Nanomaterials 1 publication, 2%
Applied Physics A: Materials Science and Processing	Applied Physics A: Materials Science and Processing, 1, 2% Applied Physics A: Materials Science and Processing 1 publication, 2%
Scientific Reports	Scientific Reports, 1, 2% Scientific Reports 1 publication, 2%
Materials Research Express	Materials Research Express, 1, 2% Materials Research Express 1 publication, 2%
IOP Conference Series: Materials Science and Engineering	IOP Conference Series: Materials Science and Engineering, 1, 2% IOP Conference Series: Materials Science and Engineering 1 publication, 2%
Journal Physics D: Applied Physics	Journal Physics D: Applied Physics, 1, 2% Journal Physics D: Applied Physics 1 publication, 2%
Journal of Physics and Chemistry of Solids	Journal of Physics and Chemistry of Solids, 1, 2% Journal of Physics and Chemistry of Solids 1 publication, 2%
Science Bulletin	Science Bulletin, 1, 2% Science Bulletin 1 publication, 2%
Journal of Alloys and Compounds	Journal of Alloys and Compounds, 1, 2% Journal of Alloys and Compounds 1 publication, 2%
Journal of the American Ceramic Society	Journal of the American Ceramic Society, 1, 2% Journal of the American Ceramic Society 1 publication, 2%
Physica Status Solidi (B): Basic Research	Physica Status Solidi (B): Basic Research, 1, 2% Physica Status Solidi (B): Basic Research 1 publication, 2%
Nano Letters	Nano Letters, 1, 2% Nano Letters 1 publication, 2%
JETP Letters	JETP Letters, 1, 2% JETP Letters 1 publication, 2%
Contemporary Physics	Contemporary Physics, 1, 2% Contemporary Physics 1 publication, 2%
Optical Materials Express	Optical Materials Express, 1, 2% Optical Materials Express 1 publication, 2%
Photonics Research	Photonics Research, 1, 2% Photonics Research 1 publication, 2%
Optics Express	Optics Express, 1, 2% Optics Express 1 publication, 2%
Uspehi Fiziki Metallov	Uspehi Fiziki Metallov, 1, 2% Uspehi Fiziki Metallov 1 publication, 2%
Photonics Russia	Photonics Russia, 1, 2% Photonics Russia 1 publication, 2%
Materials	Materials, 1, 2% Materials 1 publication, 2%
Semiconductors	Semiconductors, 1, 2% Semiconductors 1 publication, 2%
	1 2 3 4 5

Citations by publishers

	1 2 3 4 5 6 7 8
American Physical Society (APS)	American Physical Society (APS), 8, 16% American Physical Society (APS) 8 publications, 16%
IOP Publishing	IOP Publishing, 8, 16% IOP Publishing 8 publications, 16%
American Institute of Physics (AIP)	American Institute of Physics (AIP), 5, 10% American Institute of Physics (AIP) 5 publications, 10%
Elsevier	Elsevier, 5, 10% Elsevier 5 publications, 10%
Wiley	Wiley, 3, 6% Wiley 3 publications, 6%
Optical Society of America	Optical Society of America, 3, 6% Optical Society of America 3 publications, 6%
Multidisciplinary Digital Publishing Institute (MDPI)	Multidisciplinary Digital Publishing Institute (MDPI), 2, 4% Multidisciplinary Digital Publishing Institute (MDPI) 2 publications, 4%
Springer Nature	Springer Nature, 2, 4% Springer Nature 2 publications, 4%
Pleiades Publishing	Pleiades Publishing, 2, 4% Pleiades Publishing 2 publications, 4%
Oxford University Press	Oxford University Press, 2, 4% Oxford University Press 2 publications, 4%
American Chemical Society (ACS)	American Chemical Society (ACS), 1, 2% American Chemical Society (ACS) 1 publication, 2%
Taylor & Francis	Taylor & Francis, 1, 2% Taylor & Francis 1 publication, 2%
G.V. Kurdyumov Institute for Metal Physics of N.A.S. of Ukraine	G.V. Kurdyumov Institute for Metal Physics of N.A.S. of Ukraine, 1, 2% G.V. Kurdyumov Institute for Metal Physics of N.A.S. of Ukraine 1 publication, 2%
Technosphera JSC	Technosphera JSC, 1, 2% Technosphera JSC 1 publication, 2%
Treatise	Treatise, 1, 2% Treatise 1 publication, 2%
IEEE	IEEE, 1, 2% IEEE 1 publication, 2%
	1 2 3 4 5 6 7 8

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Banerjee A. et al. Characterisation of amorphous molybdenum silicide (MoSi) superconducting thin films and nanowires // Superconductor Science and Technology. 2017. Vol. 30. No. 8. p. 84010.

GOST all authors (up to 50) Copy

Banerjee A., Baker L. J., Doye A., Nord M., Heath R. M., Erotokritou K., Bosworth D., Barber Z. H., Maclaren I., HADFIELD R. A. Characterisation of amorphous molybdenum silicide (MoSi) superconducting thin films and nanowires // Superconductor Science and Technology. 2017. Vol. 30. No. 8. p. 84010.

RIS |

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RIS Copy

TY - JOUR

DO - 10.1088/1361-6668/aa76d8

UR - https://doi.org/10.1088/1361-6668/aa76d8

TI - Characterisation of amorphous molybdenum silicide (MoSi) superconducting thin films and nanowires

T2 - Superconductor Science and Technology

AU - Banerjee, Archan

AU - Baker, Luke J

AU - Doye, Alastair

AU - Nord, Magnus

AU - Heath, Robert M

AU - Erotokritou, Kleanthis

AU - Bosworth, David

AU - Barber, Zoe H.

AU - Maclaren, Ian

AU - HADFIELD, R A

PY - 2017

DA - 2017/07/12 00:00:00

PB - IOP Publishing

SP - 84010

IS - 8

VL - 30

SN - 0953-2048

SN - 1361-6668

ER -

BibTex |

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BibTex Copy

@article{2017_Banerjee,

author = {Archan Banerjee and Luke J Baker and Alastair Doye and Magnus Nord and Robert M Heath and Kleanthis Erotokritou and David Bosworth and Zoe H. Barber and Ian Maclaren and R A HADFIELD},

title = {Characterisation of amorphous molybdenum silicide (MoSi) superconducting thin films and nanowires},

journal = {Superconductor Science and Technology},

year = {2017},

volume = {30},

publisher = {IOP Publishing},

month = {jul},

url = {https://doi.org/10.1088/1361-6668/aa76d8},

number = {8},

pages = {84010},

doi = {10.1088/1361-6668/aa76d8}

}

MLA

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Banerjee, Archan, et al. “Characterisation of amorphous molybdenum silicide (MoSi) superconducting thin films and nanowires.” Superconductor Science and Technology, vol. 30, no. 8, Jul. 2017, p. 84010. https://doi.org/10.1088/1361-6668/aa76d8.

Found error?

Publisher

IOP Publishing

Journal

Superconductor Science and Technology

Quartile SCImago

Quartile WOS

Impact factor

3.6

ISSN

09532048 (Print)
13616668 (Electronic)