Microscopy and Microanalysis

Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements

Marcel Schloz ¹

Thomas C Pekin ¹

Hamish G Brown ²

Dana O Byrne ^{3, 4}

Bryan D. Esser ⁵

Emmanuel Terzoudis-Lumsden ⁶

Takashi Taniguchi ⁷

Kenji Watanabe ⁸

Scott D. Findlay ⁶

Benedikt Haas ¹

Jim Ciston ⁴

Christoph T. Koch ¹

Hide authors affiliations Show authors affiliations: 8 affiliations

Department of Physics and Center for the Science of Materials Berlin, Humboldt-Universität zu Berlin , Newtonstraße 15, Berlin 12489 , |

Ian Holmes Imaging Centre, Bio21 Molecular Science and Biotechnology Institute, University of Melbourne , Melbourne, Victoria 3010 , |

Department of Chemistry, University of California , Berkeley, CA 94720 , |

⁴

National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory , Berkeley, CA 94720 , |

⁵

Monash Centre for Electron Microscopy, Monash University , Clayton, Victoria 3800 , |

⁶

School of Physics and Astronomy, Monash University , Clayton, Victoria 3800 , |

⁷

International Center for Materials Nanoarchitectonics, National Institute for Materials Science , 1-1 Namiki, Tsukuba 305-0044 , |

⁸

Research for Functional Materials, National Institute for Materials Science , 1-1 Namiki, Tsukuba 305-0044 , |

Publication type: Journal Article

Publication date: 2024-11-18

Oxford University Press

Microscopy and Microanalysis

scimago Q2

wos Q1

SJR: 0.465

CiteScore: 1.3

Impact factor: 3.0

ISSN: 14319276, 14358115

DOI: 10.1093/mam/ozae110

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PubMed ID: 39558540

Abstract

A detailed analysis of ptychography for three-dimensional (3D) phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychography, regularized ptychography, and multi-mode ptychography. Additionally, we contrast multi-focus ptychography with an alternative method that uses virtual optical sectioning through a reconstructed scattering matrix (S-matrix), which offers more precise 3D structure information compared to conventional ptychography. Our findings from multiple 3D reconstructions based on simulated and experimental data demonstrate that multi-focus ptychography surpasses other techniques, particularly in accurately reconstructing the surfaces and interface regions of thick specimens.

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Schloz M. et al. Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements // Microscopy and Microanalysis. 2024.

GOST all authors (up to 50) Copy

Schloz M., Pekin T. C., Brown H. G., Byrne D. O., Esser B. D., Terzoudis-Lumsden E., Taniguchi T., Watanabe K., Findlay S. D., Haas B., Ciston J., Koch C. T. Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements // Microscopy and Microanalysis. 2024.

RIS |

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RIS Copy

TY - JOUR

DO - 10.1093/mam/ozae110

UR - https://academic.oup.com/mam/advance-article/doi/10.1093/mam/ozae110/7903104

TI - Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements

T2 - Microscopy and Microanalysis

AU - Schloz, Marcel

AU - Pekin, Thomas C

AU - Brown, Hamish G

AU - Byrne, Dana O

AU - Esser, Bryan D.

AU - Terzoudis-Lumsden, Emmanuel

AU - Taniguchi, Takashi

AU - Watanabe, Kenji

AU - Findlay, Scott D.

AU - Haas, Benedikt

AU - Ciston, Jim

AU - Koch, Christoph T.

PY - 2024

DA - 2024/11/18

PB - Oxford University Press

PMID - 39558540

SN - 1431-9276

SN - 1435-8115

ER -

BibTex

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BibTex (up to 50 authors) Copy

@article{2024_Schloz,

author = {Marcel Schloz and Thomas C Pekin and Hamish G Brown and Dana O Byrne and Bryan D. Esser and Emmanuel Terzoudis-Lumsden and Takashi Taniguchi and Kenji Watanabe and Scott D. Findlay and Benedikt Haas and Jim Ciston and Christoph T. Koch},

title = {Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements},

journal = {Microscopy and Microanalysis},

year = {2024},

publisher = {Oxford University Press},

month = {nov},

url = {https://academic.oup.com/mam/advance-article/doi/10.1093/mam/ozae110/7903104},

doi = {10.1093/mam/ozae110}

}

Publisher

Oxford University Press

Journal

Microscopy and Microanalysis

scimago Q2

wos Q1

SJR

0.465

CiteScore

1.3

Impact factor

3.0

ISSN

14319276 (Print)

14358115 (Electronic)

Profiles

Kenji Watanabe