Physical Review B, volume 81, issue 11, publication number 115439

Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope

M. R. Hummon ¹

A J Stollenwerk ¹

A. Stollenwerk ¹

V. Narayanamurti ¹

Polina Anikeeva ²

P O Anikeeva ²

M. J. Panzer ²

V. Wood ²

Vanessa Wood ²

V Bulović ²

Vladimir Bulović ²

Hide authors affiliations Show authors affiliations: 2 affiliations

School of Engineering And Applied Sciences, Harvard University, Cambridge, Massachusetts 02138, USA |

Laboratory of Organic Optics and Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA |

Publication type: Journal Article

Publication date: 2010-03-22

American Physical Society (APS)

Journal: Physical Review B

Quartile SCImago

Quartile WOS

Impact factor: 3.7

ISSN: 24699950, 24699969, 10980121, 1550235X

DOI: 10.1103/physrevb.81.115439

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Electronic, Optical and Magnetic Materials

Condensed Matter Physics

Abstract

We use a scanning tunneling microscope to probe single-electron charging phenomena in individual CdSe/ZnS (core/shell) quantum dots (QDs) at room temperature. The QDs are deposited on top of a bare Au thin film and form a double-barrier tunnel junction (DBTJ) between the tip, QD, and substrate. Analysis of room-temperature hysteresis in the current-voltage $(IV)$ tunneling spectra, is consistent with trapped charge(s) presenting an additional potential barrier to tunneling, a measure of the Coulomb blockade. The paper describes the first direct electrical measurement of the trap-state energy on individual QDs. Manipulation of the charge occupation of the QD, verified by measuring the charging energy, $(61.4\ifmmode\pm\else\textpm\fi{}2.4)\text{ }\text{meV}$, and analysis of the DBTJ, show trap states $\ensuremath{\sim}1.09\text{ }\text{eV}$ below the QD conduction-band edge. In addition, the detrapping time, a measure of the tunneling barrier thickness, is determined to have an upper time limit of 250 ms. We hypothesize that the charge is trapped in a quantum-dot surface state.

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Citations by journals

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Nano Letters	Nano Letters, 7, 16.28% Nano Letters 7 publications, 16.28%
ACS applied materials & interfaces	ACS applied materials & interfaces, 2, 4.65% ACS applied materials & interfaces 2 publications, 4.65%
ACS Nano	ACS Nano, 2, 4.65% ACS Nano 2 publications, 4.65%
Journal of Applied Physics	Journal of Applied Physics, 1, 2.33% Journal of Applied Physics 1 publication, 2.33%
Applied Physics Letters	Applied Physics Letters, 1, 2.33% Applied Physics Letters 1 publication, 2.33%
Review of Scientific Instruments	Review of Scientific Instruments, 1, 2.33% Review of Scientific Instruments 1 publication, 2.33%
Physical Review B	Physical Review B, 1, 2.33% Physical Review B 1 publication, 2.33%
International Journal of Molecular Sciences	International Journal of Molecular Sciences, 1, 2.33% International Journal of Molecular Sciences 1 publication, 2.33%
Small	Small, 1, 2.33% Small 1 publication, 2.33%
TrAC - Trends in Analytical Chemistry	TrAC - Trends in Analytical Chemistry, 1, 2.33% TrAC - Trends in Analytical Chemistry 1 publication, 2.33%
Journal of Physics Condensed Matter	Journal of Physics Condensed Matter, 1, 2.33% Journal of Physics Condensed Matter 1 publication, 2.33%
Surface Science	Surface Science, 1, 2.33% Surface Science 1 publication, 2.33%
Optics Communications	Optics Communications, 1, 2.33% Optics Communications 1 publication, 2.33%
Solid State Communications	Solid State Communications, 1, 2.33% Solid State Communications 1 publication, 2.33%
Biosensors and Bioelectronics	Biosensors and Bioelectronics, 1, 2.33% Biosensors and Bioelectronics 1 publication, 2.33%
Physica Status Solidi - Rapid Research Letters	Physica Status Solidi - Rapid Research Letters, 1, 2.33% Physica Status Solidi - Rapid Research Letters 1 publication, 2.33%
Advanced Materials	Advanced Materials, 1, 2.33% Advanced Materials 1 publication, 2.33%
Journal of Physical Chemistry C	Journal of Physical Chemistry C, 1, 2.33% Journal of Physical Chemistry C 1 publication, 2.33%
Analytical Chemistry	Analytical Chemistry, 1, 2.33% Analytical Chemistry 1 publication, 2.33%
Journal of the American Chemical Society	Journal of the American Chemical Society, 1, 2.33% Journal of the American Chemical Society 1 publication, 2.33%
Langmuir	Langmuir, 1, 2.33% Langmuir 1 publication, 2.33%
Journal of Physical Chemistry Letters	Journal of Physical Chemistry Letters, 1, 2.33% Journal of Physical Chemistry Letters 1 publication, 2.33%
Chemical Society Reviews	Chemical Society Reviews, 1, 2.33% Chemical Society Reviews 1 publication, 2.33%
Physical Chemistry Chemical Physics	Physical Chemistry Chemical Physics, 1, 2.33% Physical Chemistry Chemical Physics 1 publication, 2.33%
Nanoscale	Nanoscale, 1, 2.33% Nanoscale 1 publication, 2.33%
Semiconductors	Semiconductors, 1, 2.33% Semiconductors 1 publication, 2.33%
Journal of Experimental and Theoretical Physics	Journal of Experimental and Theoretical Physics, 1, 2.33% Journal of Experimental and Theoretical Physics 1 publication, 2.33%
IEEE Transactions on Dielectrics and Electrical Insulation	IEEE Transactions on Dielectrics and Electrical Insulation, 1, 2.33% IEEE Transactions on Dielectrics and Electrical Insulation 1 publication, 2.33%
Bulletin of the Russian Academy of Sciences: Physics	Bulletin of the Russian Academy of Sciences: Physics, 1, 2.33% Bulletin of the Russian Academy of Sciences: Physics 1 publication, 2.33%
	1 2 3 4 5 6 7

Citations by publishers

	2 4 6 8 10 12 14 16 18
American Chemical Society (ACS)	American Chemical Society (ACS), 17, 39.53% American Chemical Society (ACS) 17 publications, 39.53%
Elsevier	Elsevier, 5, 11.63% Elsevier 5 publications, 11.63%
Wiley	Wiley, 4, 9.3% Wiley 4 publications, 9.3%
American Institute of Physics (AIP)	American Institute of Physics (AIP), 3, 6.98% American Institute of Physics (AIP) 3 publications, 6.98%
Royal Society of Chemistry (RSC)	Royal Society of Chemistry (RSC), 3, 6.98% Royal Society of Chemistry (RSC) 3 publications, 6.98%
Pleiades Publishing	Pleiades Publishing, 3, 6.98% Pleiades Publishing 3 publications, 6.98%
IEEE	IEEE, 2, 4.65% IEEE 2 publications, 4.65%
American Physical Society (APS)	American Physical Society (APS), 1, 2.33% American Physical Society (APS) 1 publication, 2.33%
Multidisciplinary Digital Publishing Institute (MDPI)	Multidisciplinary Digital Publishing Institute (MDPI), 1, 2.33% Multidisciplinary Digital Publishing Institute (MDPI) 1 publication, 2.33%
IOP Publishing	IOP Publishing, 1, 2.33% IOP Publishing 1 publication, 2.33%
Beilstein-Institut	Beilstein-Institut, 1, 2.33% Beilstein-Institut 1 publication, 2.33%
Autonomous Non-profit Organization Editorial Board of the journal Uspekhi Khimii	Autonomous Non-profit Organization Editorial Board of the journal Uspekhi Khimii, 1, 2.33% Autonomous Non-profit Organization Editorial Board of the journal Uspekhi Khimii 1 publication, 2.33%
	2 4 6 8 10 12 14 16 18

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Hummon M. R. et al. Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope // Physical Review B. 2010. Vol. 81. No. 11. 115439

GOST all authors (up to 50) Copy

Hummon M. R., Stollenwerk A. J., Stollenwerk A., Narayanamurti V., Anikeeva P. O., Anikeeva P., Panzer M. J., Wood V., Wood V., Bulović V., Bulović V. Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope // Physical Review B. 2010. Vol. 81. No. 11. 115439

RIS |

Cite this

RIS Copy

TY - JOUR

DO - 10.1103/physrevb.81.115439

UR - https://doi.org/10.1103/physrevb.81.115439

TI - Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope

T2 - Physical Review B

AU - Hummon, M. R.

AU - Stollenwerk, A J

AU - Narayanamurti, V.

AU - Anikeeva, P O

AU - Panzer, M. J.

AU - Wood, V.

AU - Bulović, V

AU - Stollenwerk, A.

AU - Anikeeva, Polina

AU - Wood, Vanessa

AU - Bulović, Vladimir

PY - 2010

DA - 2010/03/22 00:00:00

PB - American Physical Society (APS)

IS - 11

VL - 81

SN - 2469-9950

SN - 2469-9969

SN - 1098-0121

SN - 1550-235X

ER -

BibTex

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BibTex Copy

@article{2010_Hummon,

author = {M. R. Hummon and A J Stollenwerk and V. Narayanamurti and P O Anikeeva and M. J. Panzer and V. Wood and V Bulović and A. Stollenwerk and Polina Anikeeva and Vanessa Wood and Vladimir Bulović},

title = {Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope},

journal = {Physical Review B},

year = {2010},

volume = {81},

publisher = {American Physical Society (APS)},

month = {mar},

url = {https://doi.org/10.1103/physrevb.81.115439},

number = {11},

doi = {10.1103/physrevb.81.115439}

}

Found error?

Publisher

American Physical Society (APS)

Journal

Physical Review B

Quartile SCImago

Quartile WOS

Impact factor

3.7

ISSN

24699950 (Print)
24699969 (Electronic)
10980121 (Print)
1550235X (Electronic)

Profiles

Wood, Vanessa C