Evolutionary search for new high-kdielectric materials: methodology and applications to hafnia-based oxides
High-kdielectric materials are important as gate oxides in microelectronics and as potential dielectrics for capacitors. In order to enable computational discovery of novel high-kdielectric materials, we propose a fitness model (energy storage density) that includes the dielectric constant, bandgap, and intrinsic breakdown field. This model, used as a fitness function in conjunction with first-principles calculations and the global optimization evolutionary algorithm USPEX, efficiently leads to practically important results. We found a number of high-fitness structures of SiO2and HfO2, some of which correspond to known phases and some of which are new. The results allow us to propose characteristics (genes) common to high-fitness structures – these are the coordination polyhedra and their degree of distortion. Our variable-composition searches in the HfO2–SiO2system uncovered several high-fitness states. This hybrid algorithm opens up a new avenue for discovering novel high-kdielectrics with both fixed and variable compositions, and will speed up the process of materials discovery.
Top-30
Journals
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Applied Physics Letters
4 publications, 8.51%
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Journal of Applied Physics
3 publications, 6.38%
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Physical Review B
2 publications, 4.26%
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Journal of Materials Chemistry C
2 publications, 4.26%
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Physical Chemistry Chemical Physics
2 publications, 4.26%
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JETP Letters
2 publications, 4.26%
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Nature Communications
1 publication, 2.13%
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Journal of Chemical Physics
1 publication, 2.13%
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Physics Letters, Section A: General, Atomic and Solid State Physics
1 publication, 2.13%
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Inorganic Chemistry
1 publication, 2.13%
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Journal of Materials Science
1 publication, 2.13%
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Scientific data
1 publication, 2.13%
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MRS Advances
1 publication, 2.13%
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Acta Materialia
1 publication, 2.13%
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Radiation Physics and Chemistry
1 publication, 2.13%
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Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
1 publication, 2.13%
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Nanotechnology
1 publication, 2.13%
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Materials Research Express
1 publication, 2.13%
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Applied Physics Express
1 publication, 2.13%
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Semiconductor Science and Technology
1 publication, 2.13%
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Computational Materials Science
1 publication, 2.13%
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Chemical Engineering Research and Design
1 publication, 2.13%
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Materials Today Communications
1 publication, 2.13%
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Advanced Electronic Materials
1 publication, 2.13%
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Small
1 publication, 2.13%
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Journal of Physical Chemistry C
1 publication, 2.13%
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RSC Advances
1 publication, 2.13%
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Nanoscale
1 publication, 2.13%
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IEICE Electronics Express
1 publication, 2.13%
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Journal of Asian Ceramic Societies
1 publication, 2.13%
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Publishers
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Elsevier
10 publications, 21.28%
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AIP Publishing
8 publications, 17.02%
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Royal Society of Chemistry (RSC)
6 publications, 12.77%
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Springer Nature
4 publications, 8.51%
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American Chemical Society (ACS)
4 publications, 8.51%
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IOP Publishing
4 publications, 8.51%
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American Physical Society (APS)
2 publications, 4.26%
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Japan Society of Applied Physics
2 publications, 4.26%
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Wiley
2 publications, 4.26%
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Pleiades Publishing
2 publications, 4.26%
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Institute of Electronics, Information and Communications Engineers (IEICE)
1 publication, 2.13%
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Taylor & Francis
1 publication, 2.13%
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Institute of Electrical and Electronics Engineers (IEEE)
1 publication, 2.13%
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- We do not take into account publications without a DOI.
- Statistics recalculated weekly.