Enhanced testing performance via unbiased test sets

Wang L.-., Mercer M.R., Williams T.W.

Publication type: Proceedings Article

Institute of Electrical and Electronics Engineers (IEEE)

DOI: 10.1109/EDTC.1995.470381

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1, 33.33% IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1 publication, 33.33%
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Institute of Electrical and Electronics Engineers (IEEE)	Institute of Electrical and Electronics Engineers (IEEE), 1, 33.33% Institute of Electrical and Electronics Engineers (IEEE) 1 publication, 33.33%
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Institute of Electrical and Electronics Engineers (IEEE)