Exploiting Petri nets to support fault tree based dependability analysis

Bobbio A., Franceschinis G., Gaeta R., Portinale L.

Publication type: Proceedings Article

Institute of Electrical and Electronics Engineers (IEEE)

DOI: 10.1109/PNPM.1999.796561

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IEEE Access	IEEE Access, 2, 12.5% IEEE Access 2 publications, 12.5%
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Institute of Electrical and Electronics Engineers (IEEE)	Institute of Electrical and Electronics Engineers (IEEE), 9, 56.25% Institute of Electrical and Electronics Engineers (IEEE) 9 publications, 56.25%
Elsevier	Elsevier, 2, 12.5% Elsevier 2 publications, 12.5%
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Institute of Electrical and Electronics Engineers (IEEE)