IEEE Transactions on Applied Superconductivity, volume 27, issue 4, pages 1-9
AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool
Publication type: Journal Article
Publication date: 2017-06-01
Q2
Q3
SJR: 0.500
CiteScore: 3.5
Impact factor: 1.7
ISSN: 10518223, 15582515, 23787074
Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Abstract
We develop an ac-biased shift register introduced in our previous work (V. K. Semenov et al., IEEE Trans. Appl. Supercond., vol. 25, no. 3, 1301507, June 2015) into a benchmark circuit for evaluation of superconductor electronics fabrication technology. The developed testing technique allows for extracting margins of all individual cells in the shift register, which in turn makes it possible to estimate statistical distribution of Josephson junctions (JJs) in the circuit. We applied this approach to successfully test registers having 8-, 16-, 36-, and 202 thousand cells and, respectively, about 33-, 65-, 144-, and 809 thousand JJs. The circuits were fabricated at MIT Lincoln Laboratory, using a fully planarized process, 0.4-μm inductor linewidth and 1.33 × 106 cm−2 junction density. They are presently the largest operational superconducting SFQ circuits ever made. The developed technique distinguishes between “hard” defects (fabrication-related) and “soft” defects (measurement-related) and locates them in the circuit. The “soft” defects are specific to superconducting circuits and caused by magnetic flux trapping either inside the active cells or in the dedicated flux-trapping moats near the cells. The number and distribution of “soft” defects depend on the ambient magnetic field and vary with thermal cycling even if done in the same magnetic environment.
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Semenov V. K., Polyakov Y. A., Tolpygo S. K. AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool // IEEE Transactions on Applied Superconductivity. 2017. Vol. 27. No. 4. pp. 1-9.
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Semenov V. K., Polyakov Y. A., Tolpygo S. K. AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool // IEEE Transactions on Applied Superconductivity. 2017. Vol. 27. No. 4. pp. 1-9.
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TY - JOUR
DO - 10.1109/TASC.2017.2669585
UR - https://doi.org/10.1109/TASC.2017.2669585
TI - AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool
T2 - IEEE Transactions on Applied Superconductivity
AU - Semenov, Vasili K
AU - Polyakov, Yuri A
AU - Tolpygo, Sergey K
PY - 2017
DA - 2017/06/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 1-9
IS - 4
VL - 27
SN - 1051-8223
SN - 1558-2515
SN - 2378-7074
ER -
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@article{2017_Semenov,
author = {Vasili K Semenov and Yuri A Polyakov and Sergey K Tolpygo},
title = {AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool},
journal = {IEEE Transactions on Applied Superconductivity},
year = {2017},
volume = {27},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {jun},
url = {https://doi.org/10.1109/TASC.2017.2669585},
number = {4},
pages = {1--9},
doi = {10.1109/TASC.2017.2669585}
}
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Semenov, Vasili K., et al. “AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool.” IEEE Transactions on Applied Superconductivity, vol. 27, no. 4, Jun. 2017, pp. 1-9. https://doi.org/10.1109/TASC.2017.2669585.