IEEE Transactions on Industrial Electronics, volume 70, issue 8, pages 8286-8295

Robust Temporal Logic Motion Control via Disturbance Observers

Publication typeJournal Article
Publication date2023-08-01
Q1
Q1
SJR3.395
CiteScore16.8
Impact factor7.5
ISSN02780046, 15579948
Electrical and Electronic Engineering
Control and Systems Engineering
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Institute of Electrical and Electronics Engineers (IEEE)
4 publications, 66.67%
Instrument Society of America
1 publication, 16.67%
Springer Nature
1 publication, 16.67%
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GOST |
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GOST Copy
Zhou C. et al. Robust Temporal Logic Motion Control via Disturbance Observers // IEEE Transactions on Industrial Electronics. 2023. Vol. 70. No. 8. pp. 8286-8295.
GOST all authors (up to 50) Copy
Zhou C., Yang J., Li S., Chen W. Robust Temporal Logic Motion Control via Disturbance Observers // IEEE Transactions on Industrial Electronics. 2023. Vol. 70. No. 8. pp. 8286-8295.
RIS |
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RIS Copy
TY - JOUR
DO - 10.1109/TIE.2022.3229327
UR - https://doi.org/10.1109/TIE.2022.3229327
TI - Robust Temporal Logic Motion Control via Disturbance Observers
T2 - IEEE Transactions on Industrial Electronics
AU - Zhou, Chengqian
AU - Yang, Jun
AU - Li, Shihua
AU - Chen, Wen-Hua
PY - 2023
DA - 2023/08/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 8286-8295
IS - 8
VL - 70
SN - 0278-0046
SN - 1557-9948
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2023_Zhou,
author = {Chengqian Zhou and Jun Yang and Shihua Li and Wen-Hua Chen},
title = {Robust Temporal Logic Motion Control via Disturbance Observers},
journal = {IEEE Transactions on Industrial Electronics},
year = {2023},
volume = {70},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {aug},
url = {https://doi.org/10.1109/TIE.2022.3229327},
number = {8},
pages = {8286--8295},
doi = {10.1109/TIE.2022.3229327}
}
MLA
Cite this
MLA Copy
Zhou, Chengqian, et al. “Robust Temporal Logic Motion Control via Disturbance Observers.” IEEE Transactions on Industrial Electronics, vol. 70, no. 8, Aug. 2023, pp. 8286-8295. https://doi.org/10.1109/TIE.2022.3229327.
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