Small-Sample-Oriented Multi-Condition Fault Diagnosis Framework based on Classifier-Free Denoising Diffusion Implicit Model with Multi-Class Contrastive Learning
Publication type: Journal Article
Publication date: 2024-12-15
scimago Q1
wos Q1
SJR: 1.039
CiteScore: 8.2
Impact factor: 4.5
ISSN: 1530437X, 15581748, 23799153
Abstract
Industrial fault diagnosis (FD) is crucial for ensuring a manufacturing process’s safety, reliability, and efficiency. However, significant challenges arise from small fault sample sizes and the inherent variability of operating conditions. To tackle the above challenges, this article presents a novel small-sample-oriented FD framework, CF-DDIM-MCCL, leveraging the classifier-free denoising diffusion implicit model combined with multiclass contrastive learning. Additionally, CF-DDIM-MCCL incorporates a dynamic training termination strategy to enhance training efficiency by optimizing the learning process. It also employs a K-nearest neighbor (KNN) classifier instead of the traditional Softmax classifier, resulting in notable improvements in fault identification stability and accuracy. Extensive confirmatory and comparative experiments were conducted on two benchmark datasets, the Case Western Reserve University (CWRU) and Spectra Quest (SQ) bearing datasets, and in a real industrial application scenario, axial flow fan FD from a steel-making plant. Experimental results demonstrate the fault classification accuracies of 99.361%, 98.140%, and 98.542% across the three test cases. The outstanding performance of the proposed approach across diverse benchmark datasets and practical applications underscores its potential to revolutionize FD practices in natural industrial environments.
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Total citations:
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Citations from 2024:
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(100%)
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Liu J. et al. Small-Sample-Oriented Multi-Condition Fault Diagnosis Framework based on Classifier-Free Denoising Diffusion Implicit Model with Multi-Class Contrastive Learning // IEEE Sensors Journal. 2024. Vol. 24. No. 24. pp. 41635-41646.
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Liu J., Xiao J., Ma T., Cen L., Shao H., Yunlian L. Small-Sample-Oriented Multi-Condition Fault Diagnosis Framework based on Classifier-Free Denoising Diffusion Implicit Model with Multi-Class Contrastive Learning // IEEE Sensors Journal. 2024. Vol. 24. No. 24. pp. 41635-41646.
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TY - JOUR
DO - 10.1109/jsen.2024.3487209
UR - https://ieeexplore.ieee.org/document/10742305/
TI - Small-Sample-Oriented Multi-Condition Fault Diagnosis Framework based on Classifier-Free Denoising Diffusion Implicit Model with Multi-Class Contrastive Learning
T2 - IEEE Sensors Journal
AU - Liu, Jinping
AU - Xiao, Jingri
AU - Ma, Tianyu
AU - Cen, Lihui
AU - Shao, Haidong
AU - Yunlian, Liu
PY - 2024
DA - 2024/12/15
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 41635-41646
IS - 24
VL - 24
SN - 1530-437X
SN - 1558-1748
SN - 2379-9153
ER -
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BibTex (up to 50 authors)
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@article{2024_Liu,
author = {Jinping Liu and Jingri Xiao and Tianyu Ma and Lihui Cen and Haidong Shao and Liu Yunlian},
title = {Small-Sample-Oriented Multi-Condition Fault Diagnosis Framework based on Classifier-Free Denoising Diffusion Implicit Model with Multi-Class Contrastive Learning},
journal = {IEEE Sensors Journal},
year = {2024},
volume = {24},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {dec},
url = {https://ieeexplore.ieee.org/document/10742305/},
number = {24},
pages = {41635--41646},
doi = {10.1109/jsen.2024.3487209}
}
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MLA
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Liu, Jinping, et al. “Small-Sample-Oriented Multi-Condition Fault Diagnosis Framework based on Classifier-Free Denoising Diffusion Implicit Model with Multi-Class Contrastive Learning.” IEEE Sensors Journal, vol. 24, no. 24, Dec. 2024, pp. 41635-41646. https://ieeexplore.ieee.org/document/10742305/.