Bias point thermal shift growth in Z-cut LiNbO/sub 3/ Modulators
1
JDS Uniphase Corporation, Bloomfield, CT, USA
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Publication type: Journal Article
Publication date: 2005-06-01
scimago Q2
wos Q2
SJR: 0.687
CiteScore: 4.9
Impact factor: 2.5
ISSN: 10411135, 19410174
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering
Abstract
Growth of a bias point thermal shift induced by dc bias in z-cut LiNbO/sub 3/ optical intensity modulators is quantitatively discussed from the standpoint of its impact on field service. During 20 years of device operation under a worst-case dc bias condition, the thermal shift slope grows almost symmetrically with respect to a bias polarity. An initial small thermal shift of around /spl plusmn/7 mV//spl deg/C (3/spl sigma/ distribution bounds) increases continuously over time with biased operation at 55/spl deg/C and approaches /spl plusmn/70 mV//spl deg/C after 20 years. This increased temperature sensitivity would generate approximately a 2-V bias point shift toward the bias rail when modulator is exposed to temperature variation from 55/spl deg/C to 25/spl deg/C.
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Citations from 2024:
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Nagata H. et al. Bias point thermal shift growth in Z-cut LiNbO/sub 3/ Modulators // IEEE Photonics Technology Letters. 2005. Vol. 17. No. 6. pp. 1184-1186.
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Nagata H., Li Y., Finch A., Voisine K. R. Bias point thermal shift growth in Z-cut LiNbO/sub 3/ Modulators // IEEE Photonics Technology Letters. 2005. Vol. 17. No. 6. pp. 1184-1186.
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RIS
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TY - JOUR
DO - 10.1109/lpt.2005.846560
UR - https://doi.org/10.1109/lpt.2005.846560
TI - Bias point thermal shift growth in Z-cut LiNbO/sub 3/ Modulators
T2 - IEEE Photonics Technology Letters
AU - Nagata, H.
AU - Li, Yagang
AU - Finch, A.
AU - Voisine, K R
PY - 2005
DA - 2005/06/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 1184-1186
IS - 6
VL - 17
SN - 1041-1135
SN - 1941-0174
ER -
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BibTex (up to 50 authors)
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@article{2005_Nagata,
author = {H. Nagata and Yagang Li and A. Finch and K R Voisine},
title = {Bias point thermal shift growth in Z-cut LiNbO/sub 3/ Modulators},
journal = {IEEE Photonics Technology Letters},
year = {2005},
volume = {17},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {jun},
url = {https://doi.org/10.1109/lpt.2005.846560},
number = {6},
pages = {1184--1186},
doi = {10.1109/lpt.2005.846560}
}
Cite this
MLA
Copy
Nagata, H., et al. “Bias point thermal shift growth in Z-cut LiNbO/sub 3/ Modulators.” IEEE Photonics Technology Letters, vol. 17, no. 6, Jun. 2005, pp. 1184-1186. https://doi.org/10.1109/lpt.2005.846560.