NanoSQUIDs with proximity effect nanobridge Josephson junctions for future applications in electron microscopy
1
ER-C-1, Forschungszentrum Jülich GmbH, Jülich, Germany
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2
ER-C-1 Forschungszentrum Jülich GmbH, Jülich, Germany
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Publication type: Journal Article
Publication date: 2025-08-01
scimago Q2
wos Q3
SJR: 0.508
CiteScore: 3.4
Impact factor: 1.8
ISSN: 10518223, 15582515, 23787074
Abstract
Nanoscale superconducting quantum interference devices (nanoSQUIDs) with nanobridge Josephson junctions (nJJs) were prepared on SiN membranes for experiments with transmission electron microscope (TEM) at temperatures below 10 K. As thin-film materials for the nanobridges, metals Ti and Nb were combined into 3-layer heterostructures for adjusting superconducting parameters of the nJJs through the proximity effect. This allowed to reduce spread of parameters in ultrathin superconducting films and to adjust operating temperature of nJJs to the optimum operating temperature of the commercial TEM sample holders cooled using liquid helium. Electron beam lithography and high selectivity reactive ion etching with pure SF6 gas were used to pattern nJJs with down to 10 nm width that is comparable to coherence length in thin films of Nb. Measurements revealed non-hysteretic I(V) characteristics of the nJJs and nanoSQUIDs. The paper is mainly devoted to the development of nanoSQUIDs for possible applications in TEM. Towards realization of hybrid superconductor-ferromagnetic nanostructures for further experiments in TEM, Permalloy triangles with spatial resolution down to ∼100 nm were prepared on similar SiN membranes and studied by Lorentz TEM method. These technologies are promising for the fabrication of superconducting electronics based on nJJs for operation inside a TEM.
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Faley M. et al. NanoSQUIDs with proximity effect nanobridge Josephson junctions for future applications in electron microscopy // IEEE Transactions on Applied Superconductivity. 2025. Vol. 35. No. 5. pp. 1-5.
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Faley M., Vas J. V., Vimal Vas J., Lu P., Dunin-Borkowski R. E., Dunin-Borkowski R. NanoSQUIDs with proximity effect nanobridge Josephson junctions for future applications in electron microscopy // IEEE Transactions on Applied Superconductivity. 2025. Vol. 35. No. 5. pp. 1-5.
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TY - JOUR
DO - 10.1109/tasc.2024.3502572
UR - https://ieeexplore.ieee.org/document/10757361/
TI - NanoSQUIDs with proximity effect nanobridge Josephson junctions for future applications in electron microscopy
T2 - IEEE Transactions on Applied Superconductivity
AU - Faley, M.I.
AU - Vas, J V
AU - Vimal Vas, Joseph
AU - Lu, P.-H.
AU - Dunin-Borkowski, R. E.
AU - Dunin-Borkowski, Rafal
PY - 2025
DA - 2025/08/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 1-5
IS - 5
VL - 35
SN - 1051-8223
SN - 1558-2515
SN - 2378-7074
ER -
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@article{2025_Faley,
author = {M.I. Faley and J V Vas and Joseph Vimal Vas and P.-H. Lu and R. E. Dunin-Borkowski and Rafal Dunin-Borkowski},
title = {NanoSQUIDs with proximity effect nanobridge Josephson junctions for future applications in electron microscopy},
journal = {IEEE Transactions on Applied Superconductivity},
year = {2025},
volume = {35},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {aug},
url = {https://ieeexplore.ieee.org/document/10757361/},
number = {5},
pages = {1--5},
doi = {10.1109/tasc.2024.3502572}
}
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Faley, M.I., et al. “NanoSQUIDs with proximity effect nanobridge Josephson junctions for future applications in electron microscopy.” IEEE Transactions on Applied Superconductivity, vol. 35, no. 5, Aug. 2025, pp. 1-5. https://ieeexplore.ieee.org/document/10757361/.
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