IEEE Transactions on Industrial Informatics, volume 21, issue 3, pages 2560-2569

An Efficient Deep Neural Network for Surface Defect Detection in Industrial Edge Sensing

Jing Wang ¹

He Zou ¹

Meng Zhou ¹

Rong Su ²

School of Electrical and Control Engineering, North China University of Technology, Beijing, China |

School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore |

Publication type: Journal Article

Publication date: 2025-03-01

Institute of Electrical and Electronics Engineers (IEEE)

Journal: IEEE Transactions on Industrial Informatics

scimago Q1

SJR: 4.420

CiteScore: 24.1

Impact factor: 11.7

ISSN: 15513203, 19410050

DOI: 10.1109/tii.2024.3507954

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Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Journal

scimago Q1

SJR

4.420

CiteScore

24.1

Impact factor

11.7

ISSN

15513203 (Print)

19410050 (Electronic)