Review of Die-Attach Materials for SiC High-Temperature Packaging
Fengze Hou
1
,
Zhanxing Sun
1
,
Meiying Su
1
,
Jiajie Fan
2
,
Xiangan You
1
,
Jun Li
1
,
Qidong Wang
1
,
Liqiang Cao
1
,
Publication type: Journal Article
Publication date: 2024-10-01
scimago Q1
wos Q1
SJR: 3.083
CiteScore: 15.3
Impact factor: 6.5
ISSN: 08858993, 19410107
Abstract
Silicon carbide (SiC) devices have shown definite advantages over Si counterparts in high-temperature, high-voltage, and high-frequency applications. To fully exploit the potentiality of SiC devices in high temperatures, die-attach materials that can withstand high temperatures for a long time are required in the power electronics packaging. In this article, the high-temperature die-attach materials, such as high-temperature solders and transient liquid-phase bonding materials, were reviewed first. Then, metallic (mainly Ag and Cu) nanoparticles (NPs) sintering technologies were thoroughly overviewed. The metallic NPs sintering materials, metallic NPs sintering process, and interface and reliability were analyzed, respectively. Finally, the challenges and outlook of promising Cu NPs sintering technology were discussed.
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Metrics
26
Total citations:
26
Citations from 2024:
23
(88.47%)
Cite this
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BibTex |
MLA
Cite this
GOST
Copy
Hou F. et al. Review of Die-Attach Materials for SiC High-Temperature Packaging // IEEE Transactions on Power Electronics. 2024. Vol. 39. No. 10. pp. 13471-13486.
GOST all authors (up to 50)
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Hou F., Sun Z., Su M., Fan J., You X., Li J., Wang Q., Cao L., Zhang G. H. Review of Die-Attach Materials for SiC High-Temperature Packaging // IEEE Transactions on Power Electronics. 2024. Vol. 39. No. 10. pp. 13471-13486.
Cite this
RIS
Copy
TY - JOUR
DO - 10.1109/tpel.2024.3417529
UR - https://ieeexplore.ieee.org/document/10568422/
TI - Review of Die-Attach Materials for SiC High-Temperature Packaging
T2 - IEEE Transactions on Power Electronics
AU - Hou, Fengze
AU - Sun, Zhanxing
AU - Su, Meiying
AU - Fan, Jiajie
AU - You, Xiangan
AU - Li, Jun
AU - Wang, Qidong
AU - Cao, Liqiang
AU - Zhang, G. H.
PY - 2024
DA - 2024/10/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 13471-13486
IS - 10
VL - 39
SN - 0885-8993
SN - 1941-0107
ER -
Cite this
BibTex (up to 50 authors)
Copy
@article{2024_Hou,
author = {Fengze Hou and Zhanxing Sun and Meiying Su and Jiajie Fan and Xiangan You and Jun Li and Qidong Wang and Liqiang Cao and G. H. Zhang},
title = {Review of Die-Attach Materials for SiC High-Temperature Packaging},
journal = {IEEE Transactions on Power Electronics},
year = {2024},
volume = {39},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {oct},
url = {https://ieeexplore.ieee.org/document/10568422/},
number = {10},
pages = {13471--13486},
doi = {10.1109/tpel.2024.3417529}
}
Cite this
MLA
Copy
Hou, Fengze, et al. “Review of Die-Attach Materials for SiC High-Temperature Packaging.” IEEE Transactions on Power Electronics, vol. 39, no. 10, Oct. 2024, pp. 13471-13486. https://ieeexplore.ieee.org/document/10568422/.
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