S V Zabotnov
1
,
D V Shuleiko
1
,
M. N. Martyshov
1
,
D E Presnov
1
,
L. A. Golovan
1
,
P. K. Kashkarov
1
Publication type: Proceedings Article
Publication date: 2022-06-20
Abstract
Femtosecond laser treatment allows to fabricate periodic structures at amorphous hydrogenated silicon surfaces on areas more than a square millimeter. The period of the structures is near the laser wavelength and determines by the nonequilibrium electrons concentration at high power laser excitation. The obtained structures possess a pronounced electrophysical anisotropy.
Found
Nothing found, try to update filter.
Are you a researcher?
Create a profile to get free access to personal recommendations for colleagues and new articles.
Metrics
0
Total citations:
0
Cite this
GOST |
RIS |
BibTex
Cite this
GOST
Copy
Zabotnov S. V. et al. Anisotropic Texturing Amorphous Silicon Thin Films by Femtosecond Laser Irradiation // 2022 International Conference Laser Optics, ICLO 2022 - Proceedingss. 2022.
GOST all authors (up to 50)
Copy
Zabotnov S. V., Shuleiko D. V., Martyshov M. N., Presnov D. E., Golovan L. A., Kashkarov P. K. Anisotropic Texturing Amorphous Silicon Thin Films by Femtosecond Laser Irradiation // 2022 International Conference Laser Optics, ICLO 2022 - Proceedingss. 2022.
Cite this
RIS
Copy
TY - CPAPER
DO - 10.1109/ICLO54117.2022.9840223
UR - https://doi.org/10.1109/ICLO54117.2022.9840223
TI - Anisotropic Texturing Amorphous Silicon Thin Films by Femtosecond Laser Irradiation
T2 - 2022 International Conference Laser Optics, ICLO 2022 - Proceedingss
AU - Zabotnov, S V
AU - Shuleiko, D V
AU - Martyshov, M. N.
AU - Presnov, D E
AU - Golovan, L. A.
AU - Kashkarov, P. K.
PY - 2022
DA - 2022/06/20
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -
Cite this
BibTex (up to 50 authors)
Copy
@inproceedings{2022_Zabotnov,
author = {S V Zabotnov and D V Shuleiko and M. N. Martyshov and D E Presnov and L. A. Golovan and P. K. Kashkarov},
title = {Anisotropic Texturing Amorphous Silicon Thin Films by Femtosecond Laser Irradiation},
year = {2022},
month = {jun},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)}
}
Profiles