Performance of InGaAs/GaAs Microdisk Lasers with Improved Thermal Resistance

N. V. KRYZHANOVSKAYA 1
A S Dragunova 1
N A Fominykh 1
M. V. MAXIMOV 1
E.I. Moiseev 1
F I Zubov 1
K.A. Ivanov 1
I S Makhov 1
A M Mozharov 2
N N Kaluzhnyy 3
S.A. Mintairov 3
Yu A Guseva 3
N.Yu. Gordeev 3
A. E. ZHUKOV 1
Publication typeProceedings Article
Publication date2022-06-20
Abstract
We discuss the static characteristics and high-frequency performance of microdisk lasers with an active region based on dense array of InGaAs/GaAs quantum well-dots having the improved thermal resistance. The decrease in thermal resistance of the microlasers is achieved by epi-side down bonding on a heat-conducting Si substrate. Compared to the characteristics of initial microlasers, the bonding results in a in thermal resistance decreasing by a factor of 2.3 (1.8) in microdisks with a diameter of 19 (31)µm, Further improvement of heat removal is achieved by a thinner epitaxial structure between the active region and the heatsink, realized by concept of two coupled resonant planar waveguides. Using this method, we managed to place the active region at a distance of only 870 nm from the surface of the heterostructure and achieve the record low thermal resistance of 0.17 K/mW in bonded lasers.
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