Hybrid bonding for 3D stacked image sensors: impact of pitch shrinkage on interconnect robustness
J. Jourdon
1
,
S Lhostis
2
,
S. Moreau
3
,
J. Chossat
2
,
M. Arnoux
4
,
C. Sart
2
,
Y Henrion
2
,
P. Lamontagne
2
,
L. Arnaud
3
,
N Bresson
3
,
V. Balan
3
,
C Euvrard
3
,
Y. Exbrayat
3
,
D. Scevola
2
,
E Deloffre
2
,
S Mermoz
2
,
Andreas Martin
4
,
H Bilgen
2
,
F. Andre
2
,
Christine Charles
2
,
D. Bouchu
3
,
A. Farcy
2
,
S Guillaumet
2
,
A. Jouve
3
,
H. Fre´mont
1
,
S Cheramy
3
2
STmicroelectronics, Crolles, France
|
3
CEA-Leti, Grenoble, France
|
4
STMicroelectronics, Grenoble, France
|
Publication type: Proceedings Article
Publication date: 2018-12-01
—
Abstract
Hybrid bonding is a high-density technology for 3D integration but further interconnect scaling down could jeopardize electrical and reliability performance. A study of the influence of hybrid bonding pitch shrinkage on a 3D stacked backside illuminated CMOS image sensor was performed from a process, device performance and robustness perspectives, from 8.8 μm down to 1.44 μm bonding pitches. As a result no defect related to smaller bonding pads was evidenced neither by thermal cycling nor by electromigration, thus validating fine-pitch hybrid bonding robustness and introduction for next generation image sensors.
Top-30
Citations by journals
1
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3
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IEEE Transactions on Components, Packaging and Manufacturing Technology
3 publications, 5.45%
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IEEE Electron Device Letters
2 publications, 3.64%
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IEEE Transactions on Electron Devices
2 publications, 3.64%
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ECS Journal of Solid State Science and Technology
1 publication, 1.82%
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ACS Materials Letters
1 publication, 1.82%
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Materials
1 publication, 1.82%
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Applied Surface Science
1 publication, 1.82%
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IEEE Solid-State Circuits Letters
1 publication, 1.82%
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Crystal Growth and Design
1 publication, 1.82%
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Nanomaterials
1 publication, 1.82%
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Russian Chemical Reviews
1 publication, 1.82%
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Journal of Electronic Materials
1 publication, 1.82%
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Journal of Electronic Packaging, Transactions of the ASME
1 publication, 1.82%
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1
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3
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Citations by publishers
2
4
6
8
10
12
14
16
18
20
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IEEE
19 publications, 34.55%
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American Chemical Society (ACS)
2 publications, 3.64%
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Multidisciplinary Digital Publishing Institute (MDPI)
2 publications, 3.64%
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The Electrochemical Society
1 publication, 1.82%
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Elsevier
1 publication, 1.82%
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Autonomous Non-profit Organization Editorial Board of the journal Uspekhi Khimii
1 publication, 1.82%
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Springer Nature
1 publication, 1.82%
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ASME
1 publication, 1.82%
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2
4
6
8
10
12
14
16
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20
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- We do not take into account publications without a DOI.
- Statistics recalculated only for publications connected to researchers, organizations and labs registered on the platform.
- Statistics recalculated weekly.
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