volume 41 issue 9 pages 2251-2265

Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly

Publication typeJournal Article
Publication date2019-09-01
scimago Q1
wos Q1
SJR3.910
CiteScore35.0
Impact factor18.6
ISSN01628828, 21609292, 19393539
Computational Theory and Mathematics
Artificial Intelligence
Applied Mathematics
Software
Computer Vision and Pattern Recognition
Abstract
Due to the importance of zero-shot learning, i.e., classifying images where there is a lack of labeled training data, the number of proposed approaches has recently increased steadily. We argue that it is time to take a step back and to analyze the status quo of the area. The purpose of this paper is three-fold. First, given the fact that there is no agreed upon zero-shot learning benchmark, we first define a new benchmark by unifying both the evaluation protocols and data splits of publicly available datasets used for this task. This is an important contribution as published results are often not comparable and sometimes even flawed due to, e.g., pre-training on zero-shot test classes. Moreover, we propose a new zero-shot learning dataset, the Animals with Attributes 2 (AWA2) dataset which we make publicly available both in terms of image features and the images themselves. Second, we compare and analyze a significant number of the state-of-the-art methods in depth, both in the classic zero-shot setting but also in the more realistic generalized zero-shot setting. Finally, we discuss in detail the limitations of the current status of the area which can be taken as a basis for advancing it.
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GOST |
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GOST Copy
Xian Y. et al. Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly // IEEE Transactions on Pattern Analysis and Machine Intelligence. 2019. Vol. 41. No. 9. pp. 2251-2265.
GOST all authors (up to 50) Copy
Xian Y., Lampert C. H., Schiele B., Akata Z. Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly // IEEE Transactions on Pattern Analysis and Machine Intelligence. 2019. Vol. 41. No. 9. pp. 2251-2265.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1109/tpami.2018.2857768
UR - https://doi.org/10.1109/tpami.2018.2857768
TI - Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly
T2 - IEEE Transactions on Pattern Analysis and Machine Intelligence
AU - Xian, Yongqin
AU - Lampert, Christoph H
AU - Schiele, Bernt
AU - Akata, Zeynep
PY - 2019
DA - 2019/09/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 2251-2265
IS - 9
VL - 41
PMID - 30028691
SN - 0162-8828
SN - 2160-9292
SN - 1939-3539
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2019_Xian,
author = {Yongqin Xian and Christoph H Lampert and Bernt Schiele and Zeynep Akata},
title = {Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly},
journal = {IEEE Transactions on Pattern Analysis and Machine Intelligence},
year = {2019},
volume = {41},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {sep},
url = {https://doi.org/10.1109/tpami.2018.2857768},
number = {9},
pages = {2251--2265},
doi = {10.1109/tpami.2018.2857768}
}
MLA
Cite this
MLA Copy
Xian, Yongqin, et al. “Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly.” IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 41, no. 9, Sep. 2019, pp. 2251-2265. https://doi.org/10.1109/tpami.2018.2857768.