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Open access
Science, volume 321, issue 5895, pages 1472-1475

Imaging of Transient Structures Using Nanosecond in Situ TEM

Judy S Kim 1, 2
Thomas LaGrange 1, 2
Bryan W Reed 1, 2
Mitra L Taheri 1, 2
Michael R Armstrong 1, 2
Wayne E King 1, 2
Nigel D Browning 1, 2
Geoffrey H. Campbell 1, 2
Publication typeJournal Article
Publication date2008-09-12
Journal: Science
Quartile SCImago
Q1
Quartile WOS
Q1
Impact factor56.9
ISSN00368075, 10959203
Multidisciplinary
Abstract

The microstructure and properties of a material depend on dynamic processes such as defect motion, nucleation and growth, and phase transitions. Transmission electron microscopy (TEM) can spatially resolve these nanoscale phenomena but lacks the time resolution for direct observation. We used a photoemitted electron pulse to probe dynamic events with “snapshot” diffraction and imaging at 15-nanosecond resolution inside of a dynamic TEM. With the use of this capability, the moving reaction front of reactive nanolaminates is observed in situ. Time-resolved images and diffraction show a transient cellular morphology in a dynamically mixing, self-propagating reaction front, revealing brief phase separation during cooling, and thus provide insights into the mechanisms driving the self-propagating high-temperature synthesis.

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GOST |
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GOST Copy
Kim J. S. et al. Imaging of Transient Structures Using Nanosecond in Situ TEM // Science. 2008. Vol. 321. No. 5895. pp. 1472-1475.
GOST all authors (up to 50) Copy
Kim J. S., LaGrange T., Reed B. W., Taheri M. L., Armstrong M. R., King W. E., Browning N. D., Campbell G. H. Imaging of Transient Structures Using Nanosecond in Situ TEM // Science. 2008. Vol. 321. No. 5895. pp. 1472-1475.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1126/science.1161517
UR - https://doi.org/10.1126/science.1161517
TI - Imaging of Transient Structures Using Nanosecond in Situ TEM
T2 - Science
AU - Kim, Judy S
AU - LaGrange, Thomas
AU - Reed, Bryan W
AU - Taheri, Mitra L
AU - Armstrong, Michael R
AU - King, Wayne E
AU - Browning, Nigel D
AU - Campbell, Geoffrey H.
PY - 2008
DA - 2008/09/12
PB - American Association for the Advancement of Science (AAAS)
SP - 1472-1475
IS - 5895
VL - 321
SN - 0036-8075
SN - 1095-9203
ER -
BibTex |
Cite this
BibTex Copy
@article{2008_Kim,
author = {Judy S Kim and Thomas LaGrange and Bryan W Reed and Mitra L Taheri and Michael R Armstrong and Wayne E King and Nigel D Browning and Geoffrey H. Campbell},
title = {Imaging of Transient Structures Using Nanosecond in Situ TEM},
journal = {Science},
year = {2008},
volume = {321},
publisher = {American Association for the Advancement of Science (AAAS)},
month = {sep},
url = {https://doi.org/10.1126/science.1161517},
number = {5895},
pages = {1472--1475},
doi = {10.1126/science.1161517}
}
MLA
Cite this
MLA Copy
Kim, Judy S., et al. “Imaging of Transient Structures Using Nanosecond in Situ TEM.” Science, vol. 321, no. 5895, Sep. 2008, pp. 1472-1475. https://doi.org/10.1126/science.1161517.
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