Semiconductors, volume 39, issue 9, pages 1066

Exciton States in Semiconductor Spherical Nanostructures

S I Pokutnyi 1
1
 
Ilyichevsk Scientific Training Center, Mechnikov Odessa National University, Ilyichevsk, Ukraine
Publication typeJournal Article
Publication date2005-09-19
Journal: Semiconductors
Q4
Q4
SJR0.173
CiteScore1.5
Impact factor0.6
ISSN10637826, 10906479, 17267315, 09412751
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Abstract
The results of theoretical studies of the energy spectra of excitons moving in semiconductor spherical quantum dots are described. The contributions of the kinetic electron and hole energies, the energy of the Coulomb interaction between an electron and hole, and the energy of the polarization interaction between them to the energy spectrum of an exciton in a quantum dot with a spherical (quantum dot)-(insulator medium) interface is analyzed.

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Pokutnyi S. I. Exciton States in Semiconductor Spherical Nanostructures // Semiconductors. 2005. Vol. 39. No. 9. p. 1066.
GOST all authors (up to 50) Copy
Pokutnyi S. I. Exciton States in Semiconductor Spherical Nanostructures // Semiconductors. 2005. Vol. 39. No. 9. p. 1066.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1134/1.2042600
UR - https://doi.org/10.1134/1.2042600
TI - Exciton States in Semiconductor Spherical Nanostructures
T2 - Semiconductors
AU - Pokutnyi, S I
PY - 2005
DA - 2005/09/19
PB - Pleiades Publishing
SP - 1066
IS - 9
VL - 39
SN - 1063-7826
SN - 1090-6479
SN - 1726-7315
SN - 0941-2751
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2005_Pokutnyi,
author = {S I Pokutnyi},
title = {Exciton States in Semiconductor Spherical Nanostructures},
journal = {Semiconductors},
year = {2005},
volume = {39},
publisher = {Pleiades Publishing},
month = {sep},
url = {https://doi.org/10.1134/1.2042600},
number = {9},
pages = {1066},
doi = {10.1134/1.2042600}
}
MLA
Cite this
MLA Copy
Pokutnyi, S. I.. “Exciton States in Semiconductor Spherical Nanostructures.” Semiconductors, vol. 39, no. 9, Sep. 2005, p. 1066. https://doi.org/10.1134/1.2042600.
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