JETP Letters, volume 96, issue 10, pages 668-673

Critical current in planar SNS Josephson junctions

T. E. Golikova ¹

F. Hübler ²

D. BECKMANN ²

N V Klenov ³

S V Bakurskiy ³

M Yu Kupriyanov ³

I.E. Batov ¹

V. V. Ryazanov ^{1, 4}

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Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region, Russia |

Institute of Nanotechnology, Karlsruhe Institute of Technology, Karlsruhe, Germany |

Skobeltsyn Institute of Nuclear Physics, Moscow State University, Moscow, Russia |

⁴

Moscow Institute of Physics and Technology (State University), Dolgoprudnyi, Moscow Region, Russia |

Publication type: Journal Article

Publication date: 2013-01-01

Pleiades Publishing

Journal: JETP Letters

scimago Q3

SJR: 0.327

CiteScore: 2.4

Impact factor: 1.4

ISSN: 00213640, 10906487

DOI: 10.1134/S0021364012220043

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Physics and Astronomy (miscellaneous)

Abstract

Specific features of the proximity effect and Josephson behavior of submicron planar SNS junctions fabricated by electron beam lithography and shadow evaporation have been studied experimentally and theoretically. The critical current of the junctions has been found to drastically increase with a decrease in temperature, which is associated with a change in the effective size of the weak link owing to the additional SN interface.

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Publisher

Pleiades Publishing

Journal

JETP Letters

scimago Q3

SJR

0.327

CiteScore

2.4

Impact factor

1.4

ISSN

00213640 (Print)

10906487 (Electronic)

Labs

Laboratory of Nanostructure Physics at the Moscow State University

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Critical current in planar SNS Josephson junctions

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